Low-voltage Schottky p-GaN HEMT properties under extreme repetitive short-circuit operation conditions: 2DEG pinch-off, stability, aging, robustness and failure-modes analysis

IF 1.6 4区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

Microelectronics Reliability Pub Date : 2025-07-24 DOI:10.1016/j.microrel.2025.115871

F. Richardeau , L. Ghizzo , D. Trémouilles , S. Vinnac

引用次数: 0

Abstract

The authors proposed in-depth experimentation and physical analysis showing the extreme robustness capability of low-voltage GaN HEMT in single and repetitive short-circuit. A 2DEG pinch-off behavior is analyzed depending on V_DS voltage and charges' trapping / de-trapping relaxation time. A new drain–gate leakage-current mechanism at turn-off is suggested to explain the ultimate thermal-runaway failure-mechanism.

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极端重复短路操作条件下的低压肖特基p-GaN HEMT性能：2DEG断头、稳定性、老化、鲁棒性和失效模式分析

作者提出了深入的实验和物理分析，证明了低压GaN HEMT在单次和重复短路中的极端鲁棒性。根据VDS电压和电荷的捕获/释放弛缓时间，分析了2DEG掐断行为。提出了一种新的漏极关断漏电流机制来解释最终的热失控失效机制。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Microelectronics Reliability 工程技术-工程：电子与电气

CiteScore

3.30

自引率

12.50%

发文量

342

审稿时长

68 days

期刊介绍： Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.