Polar-Axis Orientation Fluctuations and the Impact on the Intrinsic Variability in Ferroelectric Capacitors

IF 2.7 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE

IEEE Journal on Exploratory Solid-State Computational Devices and Circuits Pub Date : 2025-07-07 DOI:10.1109/JXCDC.2025.3586589

Wei Zhang;Jianze Wang;Xuanyao Fong

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Abstract

We utilized phase-field simulations to investigate the effects of polar-axis (PA) orientation fluctuations on the extrinsic properties of single ferroelectric (FE) grains, focusing on the coercive electrical field (EC) and the remnant polarization (Pr). The underlying mechanisms through which PA orientation fluctuations influence polarization behavior are studied to gain insights into variations in FE device performance and reliability. In addition, we used the Voronoi algorithm to simulate multigrain (MG) FE capacitors and assess the impact of PA orientation fluctuations on the device variability of polycrystalline FE capacitors. Our analysis shows that the PA orientation, which is a significant intrinsic factor, collectively contributes to device variability. We conclude that engineering the PA orientation helps to optimize FE device performance and reliability, which is crucial for the development of high-performance FE memory technologies.

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极轴方向波动及其对铁电电容器本征变异性的影响

利用相场模拟研究了极轴取向波动对单铁电晶粒外在特性的影响，重点研究了矫顽力电场（EC）和残余极化（Pr）。研究了PA取向波动影响极化行为的潜在机制，以深入了解FE器件性能和可靠性的变化。此外，我们使用Voronoi算法模拟了多晶FE电容器，并评估了PA取向波动对多晶FE电容器器件可变性的影响。我们的分析表明，PA的方向，这是一个重要的内在因素，共同有助于器件的可变性。我们的结论是，设计PA方向有助于优化FE器件的性能和可靠性，这对于高性能FE存储技术的发展至关重要。

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