Ejlal Shahriari;Anton I. Gusev;Antoine Silvestre de Ferron;Laurent Pecastaing;Susan Parker;Simon Bland
{"title":"Experimental and Numerical Simulation Study of a Semiconductor Opening Switch","authors":"Ejlal Shahriari;Anton I. Gusev;Antoine Silvestre de Ferron;Laurent Pecastaing;Susan Parker;Simon Bland","doi":"10.1109/TPS.2025.3573764","DOIUrl":null,"url":null,"abstract":"This article examines the nanosecond interruption of high current in semiconductor opening switch (SOS) diodes, with the goal of bridging the gap between experimental results and numerical simulations. The experimental results of SOS diodes (0.25 cm<sup>2</sup>, 0.9 kV) operating as a nanosecond interrupter are presented in a wide range of cut-off current density from 300 A/cm<sup>2</sup> to 5 kA/cm<sup>2</sup> to analyze the two modes of operation, i.e., drift step recovery diode (DSRD) and SOS. In addition, the numerical simulations of the SOS diode are conducted to investigate the dynamics of the SOS diode in the DSRD and the SOS modes using the Synopsys TCAD. A mixed-mode device with a circuit simulator is utilized to simulate the SOS effect and the dynamic processes occurring during the current cut-off stage. Finally, the experimental and numerical simulation results of the SOS current and load voltage are compared indicating: 1) the accuracy of the TCAD model in the commercially available software, and 2) the possibility of operating the SOS diode in a DSRD mode.","PeriodicalId":450,"journal":{"name":"IEEE Transactions on Plasma Science","volume":"53 7","pages":"1583-1591"},"PeriodicalIF":1.5000,"publicationDate":"2025-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11027643","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Plasma Science","FirstCategoryId":"101","ListUrlMain":"https://ieeexplore.ieee.org/document/11027643/","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"PHYSICS, FLUIDS & PLASMAS","Score":null,"Total":0}
引用次数: 0
Abstract
This article examines the nanosecond interruption of high current in semiconductor opening switch (SOS) diodes, with the goal of bridging the gap between experimental results and numerical simulations. The experimental results of SOS diodes (0.25 cm2, 0.9 kV) operating as a nanosecond interrupter are presented in a wide range of cut-off current density from 300 A/cm2 to 5 kA/cm2 to analyze the two modes of operation, i.e., drift step recovery diode (DSRD) and SOS. In addition, the numerical simulations of the SOS diode are conducted to investigate the dynamics of the SOS diode in the DSRD and the SOS modes using the Synopsys TCAD. A mixed-mode device with a circuit simulator is utilized to simulate the SOS effect and the dynamic processes occurring during the current cut-off stage. Finally, the experimental and numerical simulation results of the SOS current and load voltage are compared indicating: 1) the accuracy of the TCAD model in the commercially available software, and 2) the possibility of operating the SOS diode in a DSRD mode.
期刊介绍:
The scope covers all aspects of the theory and application of plasma science. It includes the following areas: magnetohydrodynamics; thermionics and plasma diodes; basic plasma phenomena; gaseous electronics; microwave/plasma interaction; electron, ion, and plasma sources; space plasmas; intense electron and ion beams; laser-plasma interactions; plasma diagnostics; plasma chemistry and processing; solid-state plasmas; plasma heating; plasma for controlled fusion research; high energy density plasmas; industrial/commercial applications of plasma physics; plasma waves and instabilities; and high power microwave and submillimeter wave generation.