Numerical Simulation and Theoretical Analysis on the Failure Mechanism of p-i-n Limiter Under High-Power Microwave Pulse

Abstract

Numerical simulation can present the real-time distribution of the multiphysic field of devices during the action of high-power microwave (HPM) pulse, which makes it become a highly efficient method to reveal the thermal failure of devices. The study focuses on the thermal failure of the cascaded p-i-n limiter under HPM pulses. Considering the multiphysical phenomena of p-i-n diodes and circuit elements within the limiter, the field-circuit model of the cascaded p-i-n limiter is established by transforming the transmission line into equivalent lumped circuit elements and modifying the thermal parameter models of the p-i-n diodes. Based on the model, the thermal failure effect of cascaded p-i-n limiters under HPM pulses is investigated, and the relationship between the failure power and pulsewidth is obtained, which is consistent with the results of Tasca-Wunsch law. Furthermore, the study reveals the failure mechanism of the cascaded p-i-n limiter under HPM pulses, and the thermal burnout location of the limiter is determined.