Jingrui Ma;Siqi Jia;Xiangwei Qu;Kai Wang;Lei Jin;Xiao Wei Sun
{"title":"Unraveling the Influence of Temperature on Charge Dynamics in Quantum Dot Light-Emitting Diodes","authors":"Jingrui Ma;Siqi Jia;Xiangwei Qu;Kai Wang;Lei Jin;Xiao Wei Sun","doi":"10.1109/LED.2025.3564505","DOIUrl":null,"url":null,"abstract":"The reliability and efficiency of quantum dot light-emitting diode (QLED) applications are strongly influenced by temperature, making it critical to understand how temperature affects charge dynamics and degradation mechanisms. In this work, we investigate the temperature dependence of key device parameters in QLEDs across a temperature range of −20°C to 85°C. For every 10°C increase, the external quantum efficiency decreases by ~0.65%, and the electroluminescence emission wavelength exhibits a red-shift of ~1.1 nm. Our results demonstrate that the decline in efficiency and stability at elevated temperatures is mainly attributed to the accumulation of excess electrons and the inhibition of exciton recombination. This study provides valuable insights into the degradation mechanisms, deepening our understanding of temperature-driven performance deterioration, which is crucial for the design of more durable and efficient QLEDs.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"46 7","pages":"1159-1162"},"PeriodicalIF":4.1000,"publicationDate":"2025-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10976697/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
The reliability and efficiency of quantum dot light-emitting diode (QLED) applications are strongly influenced by temperature, making it critical to understand how temperature affects charge dynamics and degradation mechanisms. In this work, we investigate the temperature dependence of key device parameters in QLEDs across a temperature range of −20°C to 85°C. For every 10°C increase, the external quantum efficiency decreases by ~0.65%, and the electroluminescence emission wavelength exhibits a red-shift of ~1.1 nm. Our results demonstrate that the decline in efficiency and stability at elevated temperatures is mainly attributed to the accumulation of excess electrons and the inhibition of exciton recombination. This study provides valuable insights into the degradation mechanisms, deepening our understanding of temperature-driven performance deterioration, which is crucial for the design of more durable and efficient QLEDs.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.