{"title":"Reliability Analysis of MEMS Millimeter-Wave Micro-Transmission Line","authors":"Lifang Zhao;Kaixue Ma;Yongqiang Wang","doi":"10.1109/TCPMT.2025.3563936","DOIUrl":null,"url":null,"abstract":"The millimeter-wave micro-transmission line with GSG turning point is designed and prepared in this letter. The circuit breaking problem occurs in the initial measurement. Through the thermal stress analysis, material interface matching, and process improvement, the tested insertion loss at 40 GHz is 0.2 dB/cm, and the reflection loss is better than 17.32 dB. After three thermal reflow at <inline-formula> <tex-math>$220~^{\\circ }$ </tex-math></inline-formula>C and 500 h high-temperature storage at <inline-formula> <tex-math>$150~^{\\circ }$ </tex-math></inline-formula>C, there is no obvious difference between the performance tests before and after. It shows that the structure stability of the millimeter wave micro-transmission line is very good, which provides a reference solution for the key technical problems in the preparation process of micro-transmission line and reliability verification.","PeriodicalId":13085,"journal":{"name":"IEEE Transactions on Components, Packaging and Manufacturing Technology","volume":"15 6","pages":"1269-1274"},"PeriodicalIF":3.0000,"publicationDate":"2025-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Components, Packaging and Manufacturing Technology","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10979679/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
The millimeter-wave micro-transmission line with GSG turning point is designed and prepared in this letter. The circuit breaking problem occurs in the initial measurement. Through the thermal stress analysis, material interface matching, and process improvement, the tested insertion loss at 40 GHz is 0.2 dB/cm, and the reflection loss is better than 17.32 dB. After three thermal reflow at $220~^{\circ }$ C and 500 h high-temperature storage at $150~^{\circ }$ C, there is no obvious difference between the performance tests before and after. It shows that the structure stability of the millimeter wave micro-transmission line is very good, which provides a reference solution for the key technical problems in the preparation process of micro-transmission line and reliability verification.
期刊介绍:
IEEE Transactions on Components, Packaging, and Manufacturing Technology publishes research and application articles on modeling, design, building blocks, technical infrastructure, and analysis underpinning electronic, photonic and MEMS packaging, in addition to new developments in passive components, electrical contacts and connectors, thermal management, and device reliability; as well as the manufacture of electronics parts and assemblies, with broad coverage of design, factory modeling, assembly methods, quality, product robustness, and design-for-environment.