3xVDD-tolerant power-rail ESD clamp circuit for negative mixed-voltage interfaces

IF 1.4 4区 物理与天体物理 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Hao-En Cheng , Ching-Lin Wu , Chun-Yu Lin
{"title":"3xVDD-tolerant power-rail ESD clamp circuit for negative mixed-voltage interfaces","authors":"Hao-En Cheng ,&nbsp;Ching-Lin Wu ,&nbsp;Chun-Yu Lin","doi":"10.1016/j.sse.2025.109185","DOIUrl":null,"url":null,"abstract":"<div><div>In this article, a novel power-rail ESD clamp circuit for negative voltage power pins has been proposed and fabricated in a 0.18-μm 1.8-V CMOS process. The proposed circuit, implemented using only 1.8-V nMOS/pMOS devices, achieves a voltage tolerance of 3xVDD (5.4 V), surpassing the 2xVDD-tolerance of most existing designs. Additionally, the circuit demonstrates HBM robustness of over 8 kV and exhibits an exceptionally low leakage current of approximately 0.7nA at room temperature, making it highly suitable for negative voltage environments in biomedical circuits, mixed-voltage applications, and power management systems.</div></div>","PeriodicalId":21909,"journal":{"name":"Solid-state Electronics","volume":"229 ","pages":"Article 109185"},"PeriodicalIF":1.4000,"publicationDate":"2025-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Solid-state Electronics","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0038110125001303","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

Abstract

In this article, a novel power-rail ESD clamp circuit for negative voltage power pins has been proposed and fabricated in a 0.18-μm 1.8-V CMOS process. The proposed circuit, implemented using only 1.8-V nMOS/pMOS devices, achieves a voltage tolerance of 3xVDD (5.4 V), surpassing the 2xVDD-tolerance of most existing designs. Additionally, the circuit demonstrates HBM robustness of over 8 kV and exhibits an exceptionally low leakage current of approximately 0.7nA at room temperature, making it highly suitable for negative voltage environments in biomedical circuits, mixed-voltage applications, and power management systems.
3xdd容限电源轨ESD箝位电路,用于负混合电压接口
本文提出了一种用于负电压电源引脚的新型电源轨ESD箝位电路,并采用0.18 μm 1.8 v CMOS工艺制作。该电路仅使用1.8 V的nMOS/pMOS器件实现,实现了3xVDD (5.4 V)的电压容限,超过了大多数现有设计的2xvdd容限。此外,该电路具有超过8 kV的HBM稳健性,并且在室温下具有约0.7nA的极低漏电流,非常适合生物医学电路、混合电压应用和电源管理系统中的负电压环境。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
Solid-state Electronics
Solid-state Electronics 物理-工程:电子与电气
CiteScore
3.00
自引率
5.90%
发文量
212
审稿时长
3 months
期刊介绍: It is the aim of this journal to bring together in one publication outstanding papers reporting new and original work in the following areas: (1) applications of solid-state physics and technology to electronics and optoelectronics, including theory and device design; (2) optical, electrical, morphological characterization techniques and parameter extraction of devices; (3) fabrication of semiconductor devices, and also device-related materials growth, measurement and evaluation; (4) the physics and modeling of submicron and nanoscale microelectronic and optoelectronic devices, including processing, measurement, and performance evaluation; (5) applications of numerical methods to the modeling and simulation of solid-state devices and processes; and (6) nanoscale electronic and optoelectronic devices, photovoltaics, sensors, and MEMS based on semiconductor and alternative electronic materials; (7) synthesis and electrooptical properties of materials for novel devices.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信