{"title":"3xVDD-tolerant power-rail ESD clamp circuit for negative mixed-voltage interfaces","authors":"Hao-En Cheng , Ching-Lin Wu , Chun-Yu Lin","doi":"10.1016/j.sse.2025.109185","DOIUrl":null,"url":null,"abstract":"<div><div>In this article, a novel power-rail ESD clamp circuit for negative voltage power pins has been proposed and fabricated in a 0.18-μm 1.8-V CMOS process. The proposed circuit, implemented using only 1.8-V nMOS/pMOS devices, achieves a voltage tolerance of 3xVDD (5.4 V), surpassing the 2xVDD-tolerance of most existing designs. Additionally, the circuit demonstrates HBM robustness of over 8 kV and exhibits an exceptionally low leakage current of approximately 0.7nA at room temperature, making it highly suitable for negative voltage environments in biomedical circuits, mixed-voltage applications, and power management systems.</div></div>","PeriodicalId":21909,"journal":{"name":"Solid-state Electronics","volume":"229 ","pages":"Article 109185"},"PeriodicalIF":1.4000,"publicationDate":"2025-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Solid-state Electronics","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0038110125001303","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
In this article, a novel power-rail ESD clamp circuit for negative voltage power pins has been proposed and fabricated in a 0.18-μm 1.8-V CMOS process. The proposed circuit, implemented using only 1.8-V nMOS/pMOS devices, achieves a voltage tolerance of 3xVDD (5.4 V), surpassing the 2xVDD-tolerance of most existing designs. Additionally, the circuit demonstrates HBM robustness of over 8 kV and exhibits an exceptionally low leakage current of approximately 0.7nA at room temperature, making it highly suitable for negative voltage environments in biomedical circuits, mixed-voltage applications, and power management systems.
期刊介绍:
It is the aim of this journal to bring together in one publication outstanding papers reporting new and original work in the following areas: (1) applications of solid-state physics and technology to electronics and optoelectronics, including theory and device design; (2) optical, electrical, morphological characterization techniques and parameter extraction of devices; (3) fabrication of semiconductor devices, and also device-related materials growth, measurement and evaluation; (4) the physics and modeling of submicron and nanoscale microelectronic and optoelectronic devices, including processing, measurement, and performance evaluation; (5) applications of numerical methods to the modeling and simulation of solid-state devices and processes; and (6) nanoscale electronic and optoelectronic devices, photovoltaics, sensors, and MEMS based on semiconductor and alternative electronic materials; (7) synthesis and electrooptical properties of materials for novel devices.