Temporal characterization of femtosecond electron pulses inside ultrafast scanning electron microscope.

IF 1.3 4区 工程技术 Q3 INSTRUMENTS & INSTRUMENTATION
Kamila Moriová, Petr Koutenský, Marius-Constantin Chirita-Mihaila, Martin Kozák
{"title":"Temporal characterization of femtosecond electron pulses inside ultrafast scanning electron microscope.","authors":"Kamila Moriová, Petr Koutenský, Marius-Constantin Chirita-Mihaila, Martin Kozák","doi":"10.1063/5.0258415","DOIUrl":null,"url":null,"abstract":"<p><p>In this work, we present the implementation of an all-optical method for directly measuring electron pulse duration in an ultrafast scanning electron microscope. Our approach is based on the interaction of electrons with the ponderomotive potential of an optical standing wave and provides a precise in situ technique to characterize femtosecond electron pulses at the interaction region across a wide range of electron energies (1-30 keV). By using single-photon photoemission of electrons by ultraviolet femtosecond laser pulses from a Schottky emitter, we achieve electron pulse durations ranging from 0.5 ps at 30 keV to 2.7 ps at 5.5 keV under optimal conditions where Coulomb interactions are negligible. In addition, we demonstrate that reducing the photon energy of the femtosecond pulses used for photoemission from 4.8 eV (257.5 nm) to 2.4 eV (515 nm) decreases the initial energy spread of emitted electrons, leading to significantly shorter pulse durations, particularly at lower electron energies.</p>","PeriodicalId":21111,"journal":{"name":"Review of Scientific Instruments","volume":"96 6","pages":""},"PeriodicalIF":1.3000,"publicationDate":"2025-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Review of Scientific Instruments","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1063/5.0258415","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
引用次数: 0

Abstract

In this work, we present the implementation of an all-optical method for directly measuring electron pulse duration in an ultrafast scanning electron microscope. Our approach is based on the interaction of electrons with the ponderomotive potential of an optical standing wave and provides a precise in situ technique to characterize femtosecond electron pulses at the interaction region across a wide range of electron energies (1-30 keV). By using single-photon photoemission of electrons by ultraviolet femtosecond laser pulses from a Schottky emitter, we achieve electron pulse durations ranging from 0.5 ps at 30 keV to 2.7 ps at 5.5 keV under optimal conditions where Coulomb interactions are negligible. In addition, we demonstrate that reducing the photon energy of the femtosecond pulses used for photoemission from 4.8 eV (257.5 nm) to 2.4 eV (515 nm) decreases the initial energy spread of emitted electrons, leading to significantly shorter pulse durations, particularly at lower electron energies.

飞秒电子脉冲在超快扫描电镜内的时间表征。
在这项工作中,我们提出了一种在超快扫描电子显微镜中直接测量电子脉冲持续时间的全光方法。我们的方法是基于电子与光驻波的质量动势的相互作用,并提供了一种精确的原位技术来表征在大范围电子能量(1-30 keV)的相互作用区域的飞秒电子脉冲。在库仑相互作用可忽略的最佳条件下,利用肖特基发射体的紫外飞秒激光脉冲对电子进行单光子光电发射,获得了30 keV时0.5 ps到5.5 keV时2.7 ps的电子脉冲持续时间。此外,我们证明了将用于光发射的飞秒脉冲的光子能量从4.8 eV (257.5 nm)降低到2.4 eV (515 nm)会减少发射电子的初始能量扩散,导致脉冲持续时间显着缩短,特别是在较低电子能量时。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
Review of Scientific Instruments
Review of Scientific Instruments 工程技术-物理:应用
CiteScore
3.00
自引率
12.50%
发文量
758
审稿时长
2.6 months
期刊介绍: Review of Scientific Instruments, is committed to the publication of advances in scientific instruments, apparatuses, and techniques. RSI seeks to meet the needs of engineers and scientists in physics, chemistry, and the life sciences.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信