Zhen Liu , ShuQing Deng , JianPing Liu , Yong Huang , Hui Yang
{"title":"Temperature-dependence of current gain and turn-on voltages of GaAs-based HBTs with different base layers grown by MOCVD","authors":"Zhen Liu , ShuQing Deng , JianPing Liu , Yong Huang , Hui Yang","doi":"10.1016/j.sse.2025.109180","DOIUrl":null,"url":null,"abstract":"<div><div>Temperature-dependence of GaAs-based heterojunction bipolar transistors with GaAs, InGaAs and GaAsSb base layers were investigated. HBT with InGaAs base was found to have the best thermal stability of current gain of <em>Δβ/ΔT</em> = −0.0828/K. Both valence-band offset (<em>ΔE<sub>V</sub></em>) of emitter–base junction and defects activation energy (<em>ΔE<sub>a</sub></em>) of base layer were accounted for the low <em>Δβ/ΔT</em> coefficient by fitting the relationship between <em>1/β</em> and <em>1/T</em> using a proposed model. In addition, lower turn-on voltages of 1.038 V and 1.036 V were extracted for HBTs with narrower bandgap InGaAs and GaAsSb bases, respectively, in contrast to 1.075 V in HBT with GaAs base.</div></div>","PeriodicalId":21909,"journal":{"name":"Solid-state Electronics","volume":"229 ","pages":"Article 109180"},"PeriodicalIF":1.4000,"publicationDate":"2025-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Solid-state Electronics","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S003811012500125X","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Temperature-dependence of GaAs-based heterojunction bipolar transistors with GaAs, InGaAs and GaAsSb base layers were investigated. HBT with InGaAs base was found to have the best thermal stability of current gain of Δβ/ΔT = −0.0828/K. Both valence-band offset (ΔEV) of emitter–base junction and defects activation energy (ΔEa) of base layer were accounted for the low Δβ/ΔT coefficient by fitting the relationship between 1/β and 1/T using a proposed model. In addition, lower turn-on voltages of 1.038 V and 1.036 V were extracted for HBTs with narrower bandgap InGaAs and GaAsSb bases, respectively, in contrast to 1.075 V in HBT with GaAs base.
期刊介绍:
It is the aim of this journal to bring together in one publication outstanding papers reporting new and original work in the following areas: (1) applications of solid-state physics and technology to electronics and optoelectronics, including theory and device design; (2) optical, electrical, morphological characterization techniques and parameter extraction of devices; (3) fabrication of semiconductor devices, and also device-related materials growth, measurement and evaluation; (4) the physics and modeling of submicron and nanoscale microelectronic and optoelectronic devices, including processing, measurement, and performance evaluation; (5) applications of numerical methods to the modeling and simulation of solid-state devices and processes; and (6) nanoscale electronic and optoelectronic devices, photovoltaics, sensors, and MEMS based on semiconductor and alternative electronic materials; (7) synthesis and electrooptical properties of materials for novel devices.