{"title":"Mechanical and electrical testing of encapsulated stretchable substrate interconnect models for emerging flexible electronic systems","authors":"Gulafsha Bhatti , Yash Agrawal , Vinay Palaparthy , Rohit Sharma , Mekala Girish Kumar","doi":"10.1016/j.microrel.2025.115824","DOIUrl":null,"url":null,"abstract":"<div><div>Flexible electronics (FE) technology incorporates stretchable interconnects to enable devices those conform to irregular surfaces, bend and stretch without sacrificing functionality. These interconnects are crafted of specialized materials and designs those can withstand mechanical deformations with facilitating seamless integration of electronic components. Serpentine structures are widely used in flexible and stretchable interconnect. However, understanding their mechanical properties under different design parameters is crucial for optimal performance and reliability. In this work, through finite element analysis (FEA), the mechanical behaviour of serpentine interconnect structures with varying geometric parameters, along with and without encapsulation layer is novely investigated. The silver (Ag) material is used as conductor, while both substrate and encapsulation layers are formed using polydimethylsiloxane (PDMS). Also, the effect of mesh analysis is performed on the stretching of the considered interconnect models. Further, the Coffin-Mansons law based fatigue cycle test and the conductivity of the interconnect are analyzed. Finally, the simulation results are validated with experimental results. This research provides essential insightful observations on the interplay between design parameters, mechanical and electrical behaviour for the development of robust stretchable interconnect geometry in flexible electronic systems.</div></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"172 ","pages":"Article 115824"},"PeriodicalIF":1.9000,"publicationDate":"2025-06-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Reliability","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0026271425002379","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Flexible electronics (FE) technology incorporates stretchable interconnects to enable devices those conform to irregular surfaces, bend and stretch without sacrificing functionality. These interconnects are crafted of specialized materials and designs those can withstand mechanical deformations with facilitating seamless integration of electronic components. Serpentine structures are widely used in flexible and stretchable interconnect. However, understanding their mechanical properties under different design parameters is crucial for optimal performance and reliability. In this work, through finite element analysis (FEA), the mechanical behaviour of serpentine interconnect structures with varying geometric parameters, along with and without encapsulation layer is novely investigated. The silver (Ag) material is used as conductor, while both substrate and encapsulation layers are formed using polydimethylsiloxane (PDMS). Also, the effect of mesh analysis is performed on the stretching of the considered interconnect models. Further, the Coffin-Mansons law based fatigue cycle test and the conductivity of the interconnect are analyzed. Finally, the simulation results are validated with experimental results. This research provides essential insightful observations on the interplay between design parameters, mechanical and electrical behaviour for the development of robust stretchable interconnect geometry in flexible electronic systems.
期刊介绍:
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.