A Bandgap Diode-Based Voltage Band Detection Circuit With Fast Response Time and Low Vmin on Intel 4 Logic Technology

IF 2 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Kedar Bhatt;Stafford Hutchins;Atresh Sanne;Mohammad M. Hasan;Zhanping Chen;Jaydeep P. Kulkarni
{"title":"A Bandgap Diode-Based Voltage Band Detection Circuit With Fast Response Time and Low Vmin on Intel 4 Logic Technology","authors":"Kedar Bhatt;Stafford Hutchins;Atresh Sanne;Mohammad M. Hasan;Zhanping Chen;Jaydeep P. Kulkarni","doi":"10.1109/LSSC.2025.3572385","DOIUrl":null,"url":null,"abstract":"A fast, accurate, single-rail voltage detection circuit (VDC) is presented. Low voltage operation is achieved by a variable gain Charge Pump (CP) followed by a Low-Dropout regulator (LDO). An Open-loop band gap reference (BGREF), passed to a dynamic comparator, achieves an undervoltage trip point of 0.62 V with 8.7 mV sigma, and an overvoltage trip point of 1.22 V with 12 mV sigma, demonstrated on Intel 4 silicon prototype. The design operates without any filter cap, allowing a fast, power-on ramp of <inline-formula> <tex-math>$2~\\mu $ </tex-math></inline-formula>s, and brown-out detection of <200 ns. A voltage band detection of 0.48–1.22 V is enabled through a finite-state machine (FSM) to modify CP and LDO gain depending on input voltage.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"157-160"},"PeriodicalIF":2.0000,"publicationDate":"2025-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Solid-State Circuits Letters","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/11008796/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0

Abstract

A fast, accurate, single-rail voltage detection circuit (VDC) is presented. Low voltage operation is achieved by a variable gain Charge Pump (CP) followed by a Low-Dropout regulator (LDO). An Open-loop band gap reference (BGREF), passed to a dynamic comparator, achieves an undervoltage trip point of 0.62 V with 8.7 mV sigma, and an overvoltage trip point of 1.22 V with 12 mV sigma, demonstrated on Intel 4 silicon prototype. The design operates without any filter cap, allowing a fast, power-on ramp of $2~\mu $ s, and brown-out detection of <200 ns. A voltage band detection of 0.48–1.22 V is enabled through a finite-state machine (FSM) to modify CP and LDO gain depending on input voltage.
基于Intel 4逻辑技术的快速响应、低Vmin的带隙二极管电压检测电路
提出了一种快速、准确的单轨电压检测电路。低电压操作是通过可变增益电荷泵(CP)和低差调节器(LDO)实现的。开环带隙基准(BGREF)传递给动态比较器,在8.7 mV sigma下实现了0.62 V的欠压跳闸点,在12 mV sigma下实现了1.22 V的过压跳闸点,在Intel 4硅原型上进行了演示。该设计无需任何滤波帽,可实现2~ $ $ s的快速上电斜坡,以及<200 ns的断电检测。通过有限状态机(FSM)实现0.48-1.22 V的电压带检测,根据输入电压修改CP和LDO增益。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
IEEE Solid-State Circuits Letters
IEEE Solid-State Circuits Letters Engineering-Electrical and Electronic Engineering
CiteScore
4.30
自引率
3.70%
发文量
52
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信