Kedar Bhatt;Stafford Hutchins;Atresh Sanne;Mohammad M. Hasan;Zhanping Chen;Jaydeep P. Kulkarni
{"title":"A Bandgap Diode-Based Voltage Band Detection Circuit With Fast Response Time and Low Vmin on Intel 4 Logic Technology","authors":"Kedar Bhatt;Stafford Hutchins;Atresh Sanne;Mohammad M. Hasan;Zhanping Chen;Jaydeep P. Kulkarni","doi":"10.1109/LSSC.2025.3572385","DOIUrl":null,"url":null,"abstract":"A fast, accurate, single-rail voltage detection circuit (VDC) is presented. Low voltage operation is achieved by a variable gain Charge Pump (CP) followed by a Low-Dropout regulator (LDO). An Open-loop band gap reference (BGREF), passed to a dynamic comparator, achieves an undervoltage trip point of 0.62 V with 8.7 mV sigma, and an overvoltage trip point of 1.22 V with 12 mV sigma, demonstrated on Intel 4 silicon prototype. The design operates without any filter cap, allowing a fast, power-on ramp of <inline-formula> <tex-math>$2~\\mu $ </tex-math></inline-formula>s, and brown-out detection of <200 ns. A voltage band detection of 0.48–1.22 V is enabled through a finite-state machine (FSM) to modify CP and LDO gain depending on input voltage.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"157-160"},"PeriodicalIF":2.0000,"publicationDate":"2025-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Solid-State Circuits Letters","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/11008796/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
A fast, accurate, single-rail voltage detection circuit (VDC) is presented. Low voltage operation is achieved by a variable gain Charge Pump (CP) followed by a Low-Dropout regulator (LDO). An Open-loop band gap reference (BGREF), passed to a dynamic comparator, achieves an undervoltage trip point of 0.62 V with 8.7 mV sigma, and an overvoltage trip point of 1.22 V with 12 mV sigma, demonstrated on Intel 4 silicon prototype. The design operates without any filter cap, allowing a fast, power-on ramp of $2~\mu $ s, and brown-out detection of <200 ns. A voltage band detection of 0.48–1.22 V is enabled through a finite-state machine (FSM) to modify CP and LDO gain depending on input voltage.