Engineering nanostructured ZnSe thin films by Gamma irradiation

IF 2 4区材料科学 Q3 MATERIALS SCIENCE, COATINGS & FILMS

Thin Solid Films Pub Date : 2025-06-04 DOI:10.1016/j.tsf.2025.140713

Tripti Gupta , Jaspreet Kaur , Annu Sharma , R.P. Chauhan

{"title":"Engineering nanostructured ZnSe thin films by Gamma irradiation","authors":"Tripti Gupta , Jaspreet Kaur , Annu Sharma , R.P. Chauhan","doi":"10.1016/j.tsf.2025.140713","DOIUrl":null,"url":null,"abstract":"<div><div>In radiation ambiance, the studies on radiation interaction with materials are imperative to have their technological applications in medical and research fields. Also, defect engineering is of profound inquisitiveness to 2-dimensional materials community. The present work aims at estimating the sensitivity of ZnSe thin films for dosimetry applications. Thus, the effects of high-dose gamma (γ) rays are explored for their structural, surface, morphological, optical, and electrical characteristics on ZnSe thin films grown on glass substrates. From XRD (X-ray Diffraction) analyses, a decrease in crystallite sizes is obtained indicating an enhancement of defects. The optical characterization of irradiated thin films shows the bandgap variation; parameters such as extinction coefficient and refractive index have also been extracted. Electrical measurements were also carried out to study thin film’s sensitivity towards different γ doses. Physical alterations that the material undergoes with irradiation can be exploited for γ dosimetry applications. The modifications induced via γ-irradiation in structural, morphological, optical, surface, and electrical have been anatomized.</div></div>","PeriodicalId":23182,"journal":{"name":"Thin Solid Films","volume":"824 ","pages":"Article 140713"},"PeriodicalIF":2.0000,"publicationDate":"2025-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Thin Solid Films","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0040609025001130","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, COATINGS & FILMS","Score":null,"Total":0}

引用次数: 0

Abstract

In radiation ambiance, the studies on radiation interaction with materials are imperative to have their technological applications in medical and research fields. Also, defect engineering is of profound inquisitiveness to 2-dimensional materials community. The present work aims at estimating the sensitivity of ZnSe thin films for dosimetry applications. Thus, the effects of high-dose gamma (γ) rays are explored for their structural, surface, morphological, optical, and electrical characteristics on ZnSe thin films grown on glass substrates. From XRD (X-ray Diffraction) analyses, a decrease in crystallite sizes is obtained indicating an enhancement of defects. The optical characterization of irradiated thin films shows the bandgap variation; parameters such as extinction coefficient and refractive index have also been extracted. Electrical measurements were also carried out to study thin film’s sensitivity towards different γ doses. Physical alterations that the material undergoes with irradiation can be exploited for γ dosimetry applications. The modifications induced via γ-irradiation in structural, morphological, optical, surface, and electrical have been anatomized.

查看原文本刊更多论文

伽玛辐照工程纳米结构ZnSe薄膜

在辐射环境中，辐射与材料相互作用的研究对于医学和科研领域的技术应用是必不可少的。缺陷工程是二维材料界的一个重要课题。本工作旨在估计ZnSe薄膜在剂量学应用中的灵敏度。因此，研究了高剂量γ射线对生长在玻璃衬底上的ZnSe薄膜的结构、表面、形态、光学和电学特性的影响。XRD （x射线衍射）分析表明，晶体尺寸减小表明缺陷增强。辐照薄膜的光学特性显示了带隙的变化；消光系数和折射率等参数也被提取出来。还进行了电测量，以研究薄膜对不同γ剂量的敏感性。材料在辐照下发生的物理变化可用于γ剂量学应用。研究了γ辐照引起的结构、形态、光学、表面和电学等方面的修饰。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

Thin Solid Films 工程技术-材料科学：膜

CiteScore

4.00

自引率

4.80%

发文量

381

审稿时长

7.5 months

期刊介绍： Thin Solid Films is an international journal which serves scientists and engineers working in the fields of thin-film synthesis, characterization, and applications. The field of thin films, which can be defined as the confluence of materials science, surface science, and applied physics, has become an identifiable unified discipline of scientific endeavor.