Guobao Zhao , Yuhang Lin , Yijun Lu , Zhong Chen , Weijie Guo
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引用次数: 0
Abstract
A deep learning network has been proposed to effectively detect Mura defects of Micro-OLED displays. The short-term dense concatenate (STDC) module has been enhanced by integrating an atrous spatial pyramid pooling with depth-wise separable convolutions (DW-ASPP), and by adding a coordinate feature fusion module (CFFM). The CFFM optimizes the integration of spatial and channel-wise features, which efficiently improves defect detection capabilities. By optimizing standard dilated convolutions with DW-ASPP, the model also maintains a certain level of operational performance. The model not only achieves a mean Intersection over Union (MIou) of 77.56%, but also maintains real-time processing speeds comparable to the original STDC network, ensuing the inspection and classification of defects of Micro-OLED displays.
为了有效地检测微oled显示器的Mura缺陷,提出了一种深度学习网络。通过融合深度可分离卷积(DW-ASPP)和坐标特征融合模块(CFFM),增强了短时密集拼接(STDC)模块。CFFM优化了空间和通道特征的集成,有效地提高了缺陷检测能力。通过DW-ASPP优化标准扩展卷积,该模型还保持了一定的运行性能。该模型不仅实现了77.56%的平均Intersection over Union (MIou),而且保持了与原始STDC网络相当的实时处理速度,从而实现了Micro-OLED显示器缺陷的检测和分类。
期刊介绍:
Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.