Suppression method of magnetic noise and loss characteristics in nanocrystalline magnetic shielding devices

IF 5.2 2区 工程技术 Q1 ENGINEERING, MULTIDISCIPLINARY
Wei Liu , Xueping Xu
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引用次数: 0

Abstract

Magnetic shielding devices (MSDs) provide a low-noise, near-zero magnetic environment for biomagnetic measurements. Existing modeling methods for magnetic noise (MN) in MSDs primarily consider the influence of nanocrystalline thickness and measurement distance on MN while neglecting the effects of lamination factor, lamination thickness, and directional anisotropy. This study proposes a novel MN computation model that comprehensively integrates lamination parameters and residual environmental interference for enhanced prediction accuracy. Additionally, the influence of nanocrystalline lamination process on core loss is thoroughly investigated, and a Bertotti loss separation model that takes into account the lamination factor and lamination thickness is established. Based on a new loss correction method, solving the imaginary part permeability related to hysteresis loss can provide support for accurate calculation of MN. Experimental validation confirms the accuracy of the proposed model, with relative errors between simulated and measured MN values being 5.02 %, 7.75 %, and 2.24 % along the X, Y, and Z axes, respectively. Optimized 30-layer lamination reduces total loss by 27 %, balancing eddy current and interfacial losses. This study contributes to the optimization of MN suppression in MSDs for ultra-sensitive sensor applications, thereby enhancing their sensitivity and accuracy.
纳米晶磁屏蔽器件中磁噪声及损耗特性的抑制方法
磁屏蔽装置(MSDs)为生物磁测量提供了低噪声、近零磁环境。现有的磁噪声建模方法主要考虑纳米晶厚度和测量距离对磁噪声的影响,而忽略了层积因子、层积厚度和方向各向异性的影响。为了提高预测精度,本文提出了一种综合考虑层压参数和残余环境干扰的MN计算模型。此外,深入研究了纳米晶层压工艺对铁芯损耗的影响,建立了考虑层压因素和层压厚度的Bertotti损耗分离模型。基于一种新的损耗校正方法,求解与磁滞损耗相关的虚部磁导率,可以为MN的精确计算提供支持。实验验证了该模型的准确性,模拟值与实测值在X、Y和Z轴上的相对误差分别为5.02%、7.75%和2.24%。优化的30层层压可减少27%的总损耗,平衡涡流和界面损耗。本研究有助于优化用于超灵敏传感器的msd中MN的抑制,从而提高其灵敏度和精度。
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来源期刊
Measurement
Measurement 工程技术-工程:综合
CiteScore
10.20
自引率
12.50%
发文量
1589
审稿时长
12.1 months
期刊介绍: Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.
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