{"title":"Image feature guided self-adaptive subset configuration for digital image correlation","authors":"Rui Li, Yifei Zhou, Yatao Xu, Licheng Zhou, Bao Yang, Zejia Liu, Yiping Liu, Liqun Tang, Zhenyu Jiang","doi":"10.1016/j.optlastec.2025.113240","DOIUrl":null,"url":null,"abstract":"<div><div>The size and shape of subset are critical factors influencing the accuracy and robustness of digital image correlation (DIC) measurements. In current DIC implementations, a subset with fixed size and shape is manually configured, highly dependent on user expertise. Moreover, this configuration often leads to suboptimal performance of DIC because it cannot fit the spatially varying speckle pattern quality or inhomogeneous deformation field. To overcome these issues, a self-adaptive subset configuration strategy is proposed that can dynamically optimize the subset at each point of interest (POI) to achieve optimal accuracy and resolution of measurements. In contrast to existing methods, our approach utilizes the information of image features to take both the localized speckle pattern quality for registration and the smoothness of deformation field into account. Experimental studies demonstrate that the method adapts effectively to various speckle patterns. It optimizes subset size and shape without manual intervention in measuring inhomogeneous deformation field and stereo reconstruction of complex surface topography. By enhancing the measurement accuracy and robustness while minimizing user dependence, this strategy is expected to facilitate the applications of DIC in diverse and challenging scenarios.</div></div>","PeriodicalId":19511,"journal":{"name":"Optics and Laser Technology","volume":"190 ","pages":"Article 113240"},"PeriodicalIF":4.6000,"publicationDate":"2025-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics and Laser Technology","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S003039922500831X","RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"OPTICS","Score":null,"Total":0}
引用次数: 0
Abstract
The size and shape of subset are critical factors influencing the accuracy and robustness of digital image correlation (DIC) measurements. In current DIC implementations, a subset with fixed size and shape is manually configured, highly dependent on user expertise. Moreover, this configuration often leads to suboptimal performance of DIC because it cannot fit the spatially varying speckle pattern quality or inhomogeneous deformation field. To overcome these issues, a self-adaptive subset configuration strategy is proposed that can dynamically optimize the subset at each point of interest (POI) to achieve optimal accuracy and resolution of measurements. In contrast to existing methods, our approach utilizes the information of image features to take both the localized speckle pattern quality for registration and the smoothness of deformation field into account. Experimental studies demonstrate that the method adapts effectively to various speckle patterns. It optimizes subset size and shape without manual intervention in measuring inhomogeneous deformation field and stereo reconstruction of complex surface topography. By enhancing the measurement accuracy and robustness while minimizing user dependence, this strategy is expected to facilitate the applications of DIC in diverse and challenging scenarios.
期刊介绍:
Optics & Laser Technology aims to provide a vehicle for the publication of a broad range of high quality research and review papers in those fields of scientific and engineering research appertaining to the development and application of the technology of optics and lasers. Papers describing original work in these areas are submitted to rigorous refereeing prior to acceptance for publication.
The scope of Optics & Laser Technology encompasses, but is not restricted to, the following areas:
•development in all types of lasers
•developments in optoelectronic devices and photonics
•developments in new photonics and optical concepts
•developments in conventional optics, optical instruments and components
•techniques of optical metrology, including interferometry and optical fibre sensors
•LIDAR and other non-contact optical measurement techniques, including optical methods in heat and fluid flow
•applications of lasers to materials processing, optical NDT display (including holography) and optical communication
•research and development in the field of laser safety including studies of hazards resulting from the applications of lasers (laser safety, hazards of laser fume)
•developments in optical computing and optical information processing
•developments in new optical materials
•developments in new optical characterization methods and techniques
•developments in quantum optics
•developments in light assisted micro and nanofabrication methods and techniques
•developments in nanophotonics and biophotonics
•developments in imaging processing and systems