Dawei Wang;Hunter D. Ellis;Dinusha Herath Mudiyanselage;Ziyi He;Bingcheng Da;Imteaz Rahaman;Izak Baranowski;Siddhant Gangwal;Dragica Vasileska;Kai Fu;Houqiang Fu
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引用次数: 0
Abstract
In this work, a guard array termination structure using hydrogen plasma technology (H-GAT) was proposed for multi-kV AlGaN/GaN heterojunction Schottky barrier diodes. A highest breakdown voltage (BV) of 9.5 kV, a specific on-resistance (${R}_{\textit {ON}}\text {)}$ of $97~\Omega \cdot $ mm, and a capacitance at zero bias (${C}_{{j}{0}}\text {)}$ of 4.2 pF/mm were achieved on p-GaN/AlGaN/GaN-on-SiC platform. The fabrication process using hydrogen plasma termination was simple and easy to implement compared with other technologies used in multi-kV devices. This work provides an effective alternative route for the future development of low-cost, high-voltage 10 kV-class GaN power electronics.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.