Ohmic Response in BiFeO3 Domain Walls by Submicron-Scale Four-Point Probe Resistance Measurements (Adv. Electron. Mater. 7/2025)

IF 5.3 2区材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY

Advanced Electronic Materials Pub Date : 2025-05-19 DOI:10.1002/aelm.202570020

Jan L. Rieck, Marcel L. Kolster, Romar A. Avila, Mian Li, Guus Rijnders, Gertjan Koster, Thom Palstra, Roeland Huijink, Beatriz Noheda

引用次数: 0

Abstract

Domain Walls

In article number 2400794, Beatriz Noheda and co-workers present four-point resistivity measurements of domain walls (DWs) in multiferroic BiFeO₃ thin films, revealing ohmic behavior in lateral DW transport. A novel, lithography-free method, using a collinear submicron-scale multi-point probe (MPP), enables the resistivity extraction of a single DW free of contact resistances. This work enhances the understanding of DW conduction and highlights the use of MPPs for nanoelectronics.

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用亚微米尺度四点探针电阻测量BiFeO3畴壁的欧姆响应。板牙。7/2025)

在文章编号2400794中，Beatriz Noheda及其同事对多铁性BiFeO3薄膜的畴壁（DWs）进行了四点电阻率测量，揭示了DW横向输运的欧姆行为。使用共线亚微米尺度多点探头（MPP）的一种新型无光刻方法，可以在没有接触电阻的情况下提取单个DW的电阻率。这项工作增强了对DW传导的理解，并突出了MPPs在纳米电子学中的应用。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Advanced Electronic Materials NANOSCIENCE & NANOTECHNOLOGYMATERIALS SCIE-MATERIALS SCIENCE, MULTIDISCIPLINARY

CiteScore

11.00

自引率

3.20%

发文量

433

期刊介绍： Advanced Electronic Materials is an interdisciplinary forum for peer-reviewed, high-quality, high-impact research in the fields of materials science, physics, and engineering of electronic and magnetic materials. It includes research on physics and physical properties of electronic and magnetic materials, spintronics, electronics, device physics and engineering, micro- and nano-electromechanical systems, and organic electronics, in addition to fundamental research.