Automated tabletop exfoliation and identification of monolayer graphene flakes.

IF 1.3 4区 工程技术 Q3 INSTRUMENTS & INSTRUMENTATION
E D S Courtney, M Pendharkar, N J Bittner, A L Sharpe, D Goldhaber-Gordon
{"title":"Automated tabletop exfoliation and identification of monolayer graphene flakes.","authors":"E D S Courtney, M Pendharkar, N J Bittner, A L Sharpe, D Goldhaber-Gordon","doi":"10.1063/5.0255656","DOIUrl":null,"url":null,"abstract":"<p><p>Over the past two decades, graphene has been intensively studied because of its remarkable mechanical, optical, and electronic properties. Initial studies were enabled by manual \"Scotch Tape\" exfoliation; nearly two decades later, this method is still widely used to obtain chemically pristine flakes of graphene and other 2D van der Waals materials. Unfortunately, the yield of large, pristine flakes with uniform thickness is inconsistent. Thus, significant time and effort are required to exfoliate and locate flakes suitable for fabricating multilayer van der Waals heterostructures. Here, we describe a relatively affordable tabletop device (the \"eXfoliator\") that can reproducibly control key parameters and largely automate the exfoliation process. In a typical exfoliation run, the eXfoliator produces 3 or more large (≥400μm2) high-quality graphene monolayer flakes, allowing new users to produce such flakes at a rate comparable to manual exfoliation by an experienced user. We use an automated mapping system and a computer vision algorithm to locate candidate flakes. Our results provide a starting point for future research efforts to identify more precisely which parameters matter for the success of exfoliation and to optimize them.</p>","PeriodicalId":21111,"journal":{"name":"Review of Scientific Instruments","volume":"96 5","pages":""},"PeriodicalIF":1.3000,"publicationDate":"2025-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Review of Scientific Instruments","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1063/5.0255656","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
引用次数: 0

Abstract

Over the past two decades, graphene has been intensively studied because of its remarkable mechanical, optical, and electronic properties. Initial studies were enabled by manual "Scotch Tape" exfoliation; nearly two decades later, this method is still widely used to obtain chemically pristine flakes of graphene and other 2D van der Waals materials. Unfortunately, the yield of large, pristine flakes with uniform thickness is inconsistent. Thus, significant time and effort are required to exfoliate and locate flakes suitable for fabricating multilayer van der Waals heterostructures. Here, we describe a relatively affordable tabletop device (the "eXfoliator") that can reproducibly control key parameters and largely automate the exfoliation process. In a typical exfoliation run, the eXfoliator produces 3 or more large (≥400μm2) high-quality graphene monolayer flakes, allowing new users to produce such flakes at a rate comparable to manual exfoliation by an experienced user. We use an automated mapping system and a computer vision algorithm to locate candidate flakes. Our results provide a starting point for future research efforts to identify more precisely which parameters matter for the success of exfoliation and to optimize them.

自动桌面剥离和鉴定单层石墨烯薄片。
在过去的二十年里,石墨烯因其卓越的机械、光学和电子特性而得到了广泛的研究。最初的研究是通过手动“透明胶带”去角质实现的;近二十年后,这种方法仍然被广泛用于获得石墨烯和其他二维范德华材料的化学原始薄片。不幸的是,具有均匀厚度的大型原始薄片的产量是不一致的。因此,需要大量的时间和精力来剥离和定位适合制造多层范德华异质结构的薄片。在这里,我们描述了一种相对便宜的桌面设备(“去角质器”),它可以重复控制关键参数,并在很大程度上自动化去角质过程。在典型的去角质运行中,eXfoliator可生产3个或更多大的(≥400μm2)高质量石墨烯单层薄片,允许新用户以与经验丰富的用户手动去角质相当的速度生产此类薄片。我们使用自动绘图系统和计算机视觉算法来定位候选薄片。我们的结果为未来的研究工作提供了一个起点,以更准确地确定哪些参数对剥离的成功起作用并对其进行优化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Review of Scientific Instruments
Review of Scientific Instruments 工程技术-物理:应用
CiteScore
3.00
自引率
12.50%
发文量
758
审稿时长
2.6 months
期刊介绍: Review of Scientific Instruments, is committed to the publication of advances in scientific instruments, apparatuses, and techniques. RSI seeks to meet the needs of engineers and scientists in physics, chemistry, and the life sciences.
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