An auxetic based geometric tuning approach in microwave sensors for enhanced sensitivity in strain measurements

IF 5.2 2区 工程技术 Q1 ENGINEERING, MULTIDISCIPLINARY
A.P. Praveen , Sreedevi K. Menon , Jeetu S. Babu , Massimo Donelli , M.P. Hariprasad
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引用次数: 0

Abstract

Reducing sensor size without compromising the antenna’s characteristics is quite a challenge in radio frequency (RF) sensors for strain measurement, due to the dependence of sensor size on wavelength. This paper explores the possibility of utilising an auxetic structure in a patch antenna to enhance the strain sensitivity at lower strains. A new design concept of auxetic-microstrip patch antenna (AMSPA) sensor is introduced for the first time in strain measurements. The radiating element of a microstrip patch antenna is modified with a hexagonal re-entrant auxetic (negative Poisson’s ratio) cluster without altering the resonant frequency. The structural and electromagnetic co-simulations are performed to investigate the strain sensitivity under tensile loads. The simulation and experiment results indicate that the AMSPA sensor is suitable for detecting lower strains without deteriorating the antenna characteristics. The results show that the proposed sensor has a higher sensitivity of −4.157 ± 0.5 kHz /µε at lower strains with an enhanced gain (+12.2 %) in comparison with conventional microstrip antenna. The auxetic architecture enable sensor miniaturization by introducing additional surface current paths without degrading the antenna performance.
一种基于形变的微波传感器几何调谐方法以提高应变测量的灵敏度
由于传感器尺寸依赖于波长,在不影响天线特性的情况下减小传感器尺寸是用于应变测量的射频(RF)传感器的一个相当大的挑战。本文探讨了在贴片天线中利用消声结构来提高低应变下应变灵敏度的可能性。在应变测量中首次提出了一种新的微带贴片天线(AMSPA)传感器的设计理念。在不改变谐振频率的情况下,将微带贴片天线的辐射单元改造成六边形重入式辅助(负泊松比)簇。通过结构和电磁联合仿真,研究了该结构在拉伸载荷下的应变敏感性。仿真和实验结果表明,AMSPA传感器在不影响天线特性的情况下,适用于检测低应变。结果表明,与传统微带天线相比,该传感器在低应变下的灵敏度为- 4.157±0.5 kHz /µε,增益提高了+ 12.2%。辅助结构通过引入额外的表面电流路径而不会降低天线性能,从而使传感器小型化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Measurement
Measurement 工程技术-工程:综合
CiteScore
10.20
自引率
12.50%
发文量
1589
审稿时长
12.1 months
期刊介绍: Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.
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