Salvatore Ethan Panasci , Emanuela Schilirò , Antal Koos , Tayfun Kutlu , Hasan Sahin , Fabrizio Roccaforte , Béla Pécz , Filippo Giannazzo
{"title":"Scalable growth of optically uniform MoWS2 alloys by sulfurization of ultrathin Mo/W stacks","authors":"Salvatore Ethan Panasci , Emanuela Schilirò , Antal Koos , Tayfun Kutlu , Hasan Sahin , Fabrizio Roccaforte , Béla Pécz , Filippo Giannazzo","doi":"10.1016/j.mssp.2025.109648","DOIUrl":null,"url":null,"abstract":"<div><div>Two-dimensional (2D) transition metal dichalcogenides (TMDs) ternary alloys, such as Mo<sub>x</sub>W<sub>1-x</sub>S<sub>2</sub>, are very appealing for the possibility of continuously tuning their excitonic bandgap by the composition. However, the deposition of ultra-thin (monolayers or few-layers) alloys with laterally uniform composition on large area represents a main challenge of currently adopted synthesis methods. In this work, we demonstrated the growth of highly uniform Mo<sub>0.5</sub>W<sub>0.5</sub>S<sub>2</sub> bi-layers on cm<sup>2</sup> size SiO<sub>2</sub>/Si substrates by employing a simple and scalable approach, i.e. the sulfurization of a pre-deposited ultra-thin Mo/W stack at a temperature of 700 °C. Comparison of Mo(1.2 nm)/SiO<sub>2</sub>, W(1.2 nm)/SiO<sub>2</sub>, and Mo(1.2 nm)/W(1.2 nm)/SiO<sub>2</sub> samples after identical sulfurization conditions revealed very different results, i.e. (i) a uniform monolayer (1L) MoS<sub>2</sub> film, (ii) separated multilayer WS<sub>2</sub> islands, and (iii) a uniform bilayer (2L) Mo<sub>0.5</sub>W<sub>0.5</sub>S<sub>2</sub> film. This indicates how W surface diffusion and coalescence on SiO<sub>2</sub> surface plays a main role in WS<sub>2</sub> islands formation, whereas the reaction between S vapour with Mo films or Mo/W stacks represents the dominant mechanism for the formation of MoS<sub>2</sub> and the MoWS<sub>2</sub> alloy. Micro-photoluminescence (PL) mapping of the obtained 2L-Mo<sub>0.5</sub>W<sub>0.5</sub>S<sub>2</sub> film showed an excellent uniformity of light emission on large area with an exciton peak at 1.97 eV, significantly blue-shifted with respect to PL emission of 1L-MoS<sub>2</sub> at 1.86 eV. Such highly uniform optical properties make the grown MoWS<sub>2</sub> alloy very promising for optoelectronic applications.</div></div>","PeriodicalId":18240,"journal":{"name":"Materials Science in Semiconductor Processing","volume":"196 ","pages":"Article 109648"},"PeriodicalIF":4.2000,"publicationDate":"2025-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials Science in Semiconductor Processing","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1369800125003853","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Two-dimensional (2D) transition metal dichalcogenides (TMDs) ternary alloys, such as MoxW1-xS2, are very appealing for the possibility of continuously tuning their excitonic bandgap by the composition. However, the deposition of ultra-thin (monolayers or few-layers) alloys with laterally uniform composition on large area represents a main challenge of currently adopted synthesis methods. In this work, we demonstrated the growth of highly uniform Mo0.5W0.5S2 bi-layers on cm2 size SiO2/Si substrates by employing a simple and scalable approach, i.e. the sulfurization of a pre-deposited ultra-thin Mo/W stack at a temperature of 700 °C. Comparison of Mo(1.2 nm)/SiO2, W(1.2 nm)/SiO2, and Mo(1.2 nm)/W(1.2 nm)/SiO2 samples after identical sulfurization conditions revealed very different results, i.e. (i) a uniform monolayer (1L) MoS2 film, (ii) separated multilayer WS2 islands, and (iii) a uniform bilayer (2L) Mo0.5W0.5S2 film. This indicates how W surface diffusion and coalescence on SiO2 surface plays a main role in WS2 islands formation, whereas the reaction between S vapour with Mo films or Mo/W stacks represents the dominant mechanism for the formation of MoS2 and the MoWS2 alloy. Micro-photoluminescence (PL) mapping of the obtained 2L-Mo0.5W0.5S2 film showed an excellent uniformity of light emission on large area with an exciton peak at 1.97 eV, significantly blue-shifted with respect to PL emission of 1L-MoS2 at 1.86 eV. Such highly uniform optical properties make the grown MoWS2 alloy very promising for optoelectronic applications.
期刊介绍:
Materials Science in Semiconductor Processing provides a unique forum for the discussion of novel processing, applications and theoretical studies of functional materials and devices for (opto)electronics, sensors, detectors, biotechnology and green energy.
Each issue will aim to provide a snapshot of current insights, new achievements, breakthroughs and future trends in such diverse fields as microelectronics, energy conversion and storage, communications, biotechnology, (photo)catalysis, nano- and thin-film technology, hybrid and composite materials, chemical processing, vapor-phase deposition, device fabrication, and modelling, which are the backbone of advanced semiconductor processing and applications.
Coverage will include: advanced lithography for submicron devices; etching and related topics; ion implantation; damage evolution and related issues; plasma and thermal CVD; rapid thermal processing; advanced metallization and interconnect schemes; thin dielectric layers, oxidation; sol-gel processing; chemical bath and (electro)chemical deposition; compound semiconductor processing; new non-oxide materials and their applications; (macro)molecular and hybrid materials; molecular dynamics, ab-initio methods, Monte Carlo, etc.; new materials and processes for discrete and integrated circuits; magnetic materials and spintronics; heterostructures and quantum devices; engineering of the electrical and optical properties of semiconductors; crystal growth mechanisms; reliability, defect density, intrinsic impurities and defects.