Experimental determination of L-subshells x-ray yields and production cross sections of thick lead (Z=82) element by impact of 15–30 keV electrons

IF 1.8 4区 物理与天体物理 Q2 SPECTROSCOPY
Kailash Verma , Hitesh Rahangdale , Kumar Ankit Upadhayay , Raj Singh , Bhupendra Singh , Namita Yadav
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引用次数: 0

Abstract

We present experimental results on the impact energy dependence of L-subshell x-ray yields and production cross sections for the thick lead target (Pb, Z = 82) under impact of 15–30 keV electrons. Results are compared with the simulation data from the Monte Carlo Penelope code with the Distorted Wave Born Approximation (DWBA) formulations. The comparison yields fairly good agreement for the L-shell x-ray yields within the experimental uncertainties. Furthermore, the present results of the intensity ratio of Lβ,Lγ and Ll lines to the intensity of Lα and their corresponding x-ray production cross sections are compared with available experimental and theoretical data; the agreement is found to be satisfactory. X-ray production cross sections for L-shell x-rays are derived by employing the thick target method (An et al., 2006). Furthermore, we have presented for the first time the experimental results on yield and x-ray production cross sections of the Ll line and have compared the results with the simulation data; the agreement between two results is found to be good within the error bars of the measurements.
15-30 keV电子冲击厚铅(Z=82)元素l -亚壳层x射线产率和生成截面的实验测定
我们给出了在15-30 keV电子冲击下厚铅靶(Pb, Z = 82)的l -亚壳层x射线产率和产生截面的影响能量依赖的实验结果。结果与蒙特卡洛Penelope代码的模拟数据进行了比较,并采用畸变波Born近似(DWBA)公式。比较结果表明,在实验不确定度范围内,l壳层x射线产率的一致性相当好。同时,将Lβ、Lγ和Ll谱线强度与Lα谱线强度之比及其对应的x射线产生截面与已有的实验和理论数据进行了比较;协议是令人满意的。采用厚靶法推导了l壳层x射线的x射线产生截面(An et al., 2006)。此外,我们还首次给出了Ll线产率和x射线产率截面的实验结果,并将结果与模拟数据进行了比较;在测量误差范围内,两种结果的一致性较好。
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来源期刊
CiteScore
3.30
自引率
5.30%
发文量
64
审稿时长
60 days
期刊介绍: The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electrons as probes or detected particles in the investigation.
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