Zilin Wang;Yunfan Shi;Qingchao Zhang;Yikang Zhou;Qian Wang;Zheyao Wang
{"title":"Fabrication of Porous Cu–Sn Microbumps for Low-Temperature Cu–Cu Bonding","authors":"Zilin Wang;Yunfan Shi;Qingchao Zhang;Yikang Zhou;Qian Wang;Zheyao Wang","doi":"10.1109/TSM.2025.3529683","DOIUrl":null,"url":null,"abstract":"Cu-Cu thermocompression bonding (TCB) is widely used in 3D integration due to its excellent electrical performance, high bonding strength, and good reliability. However, TCB needs high temperature, high pressure, and complicated chemical-mechanical-planarization (CMP). We have developed a low temperature, CMP-free Cu-Cu bonding method using porous Cu-Sn microbumps. In this paper, we further report the detailed fabrication processes and the formation principles of the porous Cu-Sn bumps, as well as the characterization results of the bonded structures. A pretreatment method is developed using sequential thermal reflow and redox treatment in a gas mixture of oxygen and formic acid to form porous Cu-Sn bumps. The gas content, temperature, and duration of the pretreatment are optimized. An array of <inline-formula> <tex-math>$1000\\times 800$ </tex-math></inline-formula> porous Cu-Sn bumps has been fabricated, and CMP-free Cu-Cu bonding has been achieved using Cu-Sn bumps at 250°C, 10 MPa, and 30 min. The bonding strength, the resistance, and the thermal reliability are evaluated.","PeriodicalId":451,"journal":{"name":"IEEE Transactions on Semiconductor Manufacturing","volume":"38 2","pages":"343-351"},"PeriodicalIF":2.3000,"publicationDate":"2025-01-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Semiconductor Manufacturing","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10841454/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Cu-Cu thermocompression bonding (TCB) is widely used in 3D integration due to its excellent electrical performance, high bonding strength, and good reliability. However, TCB needs high temperature, high pressure, and complicated chemical-mechanical-planarization (CMP). We have developed a low temperature, CMP-free Cu-Cu bonding method using porous Cu-Sn microbumps. In this paper, we further report the detailed fabrication processes and the formation principles of the porous Cu-Sn bumps, as well as the characterization results of the bonded structures. A pretreatment method is developed using sequential thermal reflow and redox treatment in a gas mixture of oxygen and formic acid to form porous Cu-Sn bumps. The gas content, temperature, and duration of the pretreatment are optimized. An array of $1000\times 800$ porous Cu-Sn bumps has been fabricated, and CMP-free Cu-Cu bonding has been achieved using Cu-Sn bumps at 250°C, 10 MPa, and 30 min. The bonding strength, the resistance, and the thermal reliability are evaluated.
期刊介绍:
The IEEE Transactions on Semiconductor Manufacturing addresses the challenging problems of manufacturing complex microelectronic components, especially very large scale integrated circuits (VLSI). Manufacturing these products requires precision micropatterning, precise control of materials properties, ultraclean work environments, and complex interactions of chemical, physical, electrical and mechanical processes.