Yingqi Wang , Yuchen Song , Runze Yu , Shengwei Meng , Yu Peng , Datong Liu
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引用次数: 0
Abstract
Spacecraft sensor data is crucial for evaluating the operating status and environment of spacecraft. However, due to factors such as component aging, space environment interference, and unstable satellite-to-ground communication, obtaining high-reliability sensor data is challenging. Additionally, the high dimensionality, complex correlations, strong temporal dependencies, and noise in sensor data further complicate efforts to improve data reliability. To address these challenges, this paper proposes a sensor reliability improvement method based on a multi-layer spatio-temporal information fusion model (STIFM). First, a moving average filter is applied to the raw data to reduce the impact of noise on modeling. Next, the Transformer model is used to establish data estimation models for different sensors in spatial scale and the same sensor in temporal scale. The outputs from these spatiotemporal models are then fused using particle filtering, and the uncertainty of the results is quantitatively assessed. Based on this, data anomaly detection and recovery are performed using the confidence interval of the STIFM output. Finally, the proposed method is validated using satellite flywheel on-orbit data. Experimental results show that the proposed method achieves at least 93.55 % accuracy in abnormal scenarios and significantly extends the mean time to failures (MTTF), outperforming existing methods. This indicates that the method proposed in this paper can effectively enhance the reliability of spacecraft sensor data.
期刊介绍:
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.