{"title":"10-second Cu/Polymer Hybrid Bonding Using Area-Selective Metal Passivation for 3D Integration","authors":"Yu-Lun Liu;Tzu-Yu Chen;Kazuaki Ebisawa;Makiko Irie;Ya-Chien Chuang;Hsiao-Wei Yeh;Satoshi Fujimura;Kuan-Neng Chen","doi":"10.1109/LED.2025.3554768","DOIUrl":null,"url":null,"abstract":"This study presents the development of a Cu/polymer hybrid bonding process achieving 10 seconds of bonding duration at low temperatures (<inline-formula> <tex-math>$150~^{\\circ }$ </tex-math></inline-formula>C to <inline-formula> <tex-math>$200~^{\\circ }$ </tex-math></inline-formula>C). Key innovations include a polymer material enabling rapid bonding (<10> <tex-math>${3}\\times {10}^{-{9}}\\Omega \\cdot $ </tex-math></inline-formula>cm2, with higher bonding temperatures yielding more consistent electrical properties. Furthermore, Daisy chain measurement and cross-sectional SEM analysis confirmed bonding and signal integrity across varying contact nodes. This work highlights the potential of Cu/polymer hybrid bonding for high-throughput and high-performance applications, addressing key bonding reliability and manufacturing efficiency challenges.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"46 5","pages":"833-836"},"PeriodicalIF":4.1000,"publicationDate":"2025-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10941735/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This study presents the development of a Cu/polymer hybrid bonding process achieving 10 seconds of bonding duration at low temperatures ($150~^{\circ }$ C to $200~^{\circ }$ C). Key innovations include a polymer material enabling rapid bonding (<10> ${3}\times {10}^{-{9}}\Omega \cdot $ cm2, with higher bonding temperatures yielding more consistent electrical properties. Furthermore, Daisy chain measurement and cross-sectional SEM analysis confirmed bonding and signal integrity across varying contact nodes. This work highlights the potential of Cu/polymer hybrid bonding for high-throughput and high-performance applications, addressing key bonding reliability and manufacturing efficiency challenges.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.