Differential proportional divider resistance method for high resolution temperature measurement

IF 5.2 2区工程技术 Q1 ENGINEERING, MULTIDISCIPLINARY

Measurement Pub Date : 2025-04-16 DOI:10.1016/j.measurement.2025.117620

Hongxing Yang , Shiyuan Lin , Chang Liu , Ziqi Yin , Yan Wang , Chenxi Du , Pengcheng Hu

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引用次数: 0

Abstract

High-resolution and high-accuracy temperature-measuring systems are vital for advanced missions in aerospace applications that require minimal temperature fluctuations (reaching levels of 0.1 mK/Hz^1/2 within a frequency range of 0.1 mHz to 1 Hz). However, drift errors and noise arising from the electrical characteristics and electronic components in a measurement circuit must be alleviated to enhance accuracy and resolution. Here, we propose a differential proportional divider-resistance measurement method to effectively mitigate low-frequency noise and long-term temperature drift errors by continuous voltage sampling and subtraction. We show the effectiveness of our method in suppressing measurement noise within the low-frequency range by measuring the noise spectral density of the proposed system. We demonstrate a resolution of 0.017 mK through an equivalent temperature measurement experiment utilizing a high-precision resistance decade box. Our findings offer new means to developing highly-resolved temperature measurements for high-precision applications.

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高分辨率温度测量的差分比例分压器电阻法

高分辨率和高精度的温度测量系统对于需要最小温度波动（在0.1 mHz至1 Hz的频率范围内达到0.1 mK/Hz1/2的水平）的航空航天应用中的高级任务至关重要。然而，为了提高测量精度和分辨率，必须消除测量电路中由电气特性和电子元件引起的漂移误差和噪声。在这里，我们提出了一种差分比例分压器电阻测量方法，通过连续电压采样和减法有效地减轻低频噪声和长期温度漂移误差。通过测量系统的噪声谱密度，我们证明了该方法在低频范围内抑制测量噪声的有效性。我们通过使用高精度电阻十进盒的等效温度测量实验证明了0.017 mK的分辨率。我们的发现为开发高精度应用的高分辨率温度测量提供了新的手段。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Measurement 工程技术-工程：综合

CiteScore

10.20

自引率

12.50%

发文量

1589

审稿时长

12.1 months

期刊介绍： Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.