M. Vogt , A. Brunko , M.R. Meier , H. Schweigart , L. Henneken , M. Schleicher , D. Schucht , N. Kaminski
{"title":"Solder mask as a reliable insulation layer on printed circuit boards–different layouts and materials under humidity and high voltage","authors":"M. Vogt , A. Brunko , M.R. Meier , H. Schweigart , L. Henneken , M. Schleicher , D. Schucht , N. Kaminski","doi":"10.1016/j.microrel.2025.115743","DOIUrl":null,"url":null,"abstract":"<div><div>After decades of improvement, the reliability of Printed Circuit Boards (PCB) is well known and standardized. However, the standards are based on outdated material properties and old experiments and thus, they contain a large safety margin, when modern insulation materials are applied. This work focuses on the insulation properties and the reliability of solder mask under high humidity and high voltages. It has been demonstrated that significantly more robust systems can be achieved than the standards specify. This leads the way for further volume reductions.</div></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"169 ","pages":"Article 115743"},"PeriodicalIF":1.6000,"publicationDate":"2025-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Reliability","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0026271425001568","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
After decades of improvement, the reliability of Printed Circuit Boards (PCB) is well known and standardized. However, the standards are based on outdated material properties and old experiments and thus, they contain a large safety margin, when modern insulation materials are applied. This work focuses on the insulation properties and the reliability of solder mask under high humidity and high voltages. It has been demonstrated that significantly more robust systems can be achieved than the standards specify. This leads the way for further volume reductions.
期刊介绍:
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.