Taeeun Lee, Yusup Jung, Jun Young Park, Sujin Kim, Sinsu Kyoung, Sola Woo
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引用次数: 0
Abstract
In this paper, a β‐Ga2O3 enhancement‐mode metal‐oxide‐semiconductor heterojunction field‐effect transistor (MOS‐HJFET) is demonstrated using a counter‐doped β‐Ga2O3 channel, achieved by the diffusion of p‐type nickel oxide (p‐NiO). The junction between the diffused p‐NiO layer and the β‐Ga2O3 channel forms a depletion region, effectively blocking the channel in the normally‐off transistor. The fabricated β‐Ga2O3 MOS‐HJFET with a counter‐doped β‐Ga2O3 channel achieves a specific on‐resistance (Ron,sp) of 32.6 mΩ·cm2, threshold voltage (Vth) of 1.3 V, supporting a drain current of over 1 mA in the discrete device, and a high on/off current ratio of 108. Furthermore, guidelines for designing the enhancement‐mode MOS‐HJFET are proposed, considering the diffused length of p‐NiO and the thickness of the β‐Ga2O3 epitaxial layer.
期刊介绍:
Advanced Electronic Materials is an interdisciplinary forum for peer-reviewed, high-quality, high-impact research in the fields of materials science, physics, and engineering of electronic and magnetic materials. It includes research on physics and physical properties of electronic and magnetic materials, spintronics, electronics, device physics and engineering, micro- and nano-electromechanical systems, and organic electronics, in addition to fundamental research.