Bi2O2Se/Ta2NiSe5 Tunneling Heterojunction for High-Performance, Polarization-Sensitive, and Broadband Infrared Photodetector

IF 5.3 2区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY
Fang Yang, Yuanfang Yu, Xinglei Zhang, Zhihao Qu, Zhaofu Chen, Shizheng Wang, Yinan Wang, Ting Zheng, Weiwei Zhao, Junpeng Lu, Hongwei Liu
{"title":"Bi2O2Se/Ta2NiSe5 Tunneling Heterojunction for High-Performance, Polarization-Sensitive, and Broadband Infrared Photodetector","authors":"Fang Yang, Yuanfang Yu, Xinglei Zhang, Zhihao Qu, Zhaofu Chen, Shizheng Wang, Yinan Wang, Ting Zheng, Weiwei Zhao, Junpeng Lu, Hongwei Liu","doi":"10.1002/aelm.202500115","DOIUrl":null,"url":null,"abstract":"New technologies such as autonomous driving, and machine vision keep pushing the photodetectors to acquire a comprehensive high performance including high responsivity, fast response, low detection limit, polarization sensitivity, and broadband photoresponse. 2D van der Waals (vdW) heterostructures have emerged as promising candidates for next-generation photodetectors due to their tailored band alignments and unique physical properties. In this work, a high-performance photodetector based on the Bi<sub>2</sub>O<sub>2</sub>Se/Ta<sub>2</sub>NiSe<sub>5</sub> heterojunction, which simultaneously achieves high responsivity (&gt;10<sup>3</sup> A W<sup>−1</sup>) and fast response time (≈5 µs) through the tunneling effect is proposed. The heterojunction device exhibits impressive sensitivity with a low detection limit, achieving ≈2 pW at 633 nm and ≈4 nW at 1550 nm. The specific detectivity can reach 3.75 × 10<sup>13</sup> Jones at 633 nm and 1.8 × 10<sup>10</sup> Jones at 1550 nm. Furthermore, high-resolution broadband and polarized light imaging are successfully demonstrated. These findings provide more opportunities for developing next-generation photodetectors with comprehensive high performance.","PeriodicalId":110,"journal":{"name":"Advanced Electronic Materials","volume":"74 1","pages":""},"PeriodicalIF":5.3000,"publicationDate":"2025-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Electronic Materials","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1002/aelm.202500115","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

Abstract

New technologies such as autonomous driving, and machine vision keep pushing the photodetectors to acquire a comprehensive high performance including high responsivity, fast response, low detection limit, polarization sensitivity, and broadband photoresponse. 2D van der Waals (vdW) heterostructures have emerged as promising candidates for next-generation photodetectors due to their tailored band alignments and unique physical properties. In this work, a high-performance photodetector based on the Bi2O2Se/Ta2NiSe5 heterojunction, which simultaneously achieves high responsivity (>103 A W−1) and fast response time (≈5 µs) through the tunneling effect is proposed. The heterojunction device exhibits impressive sensitivity with a low detection limit, achieving ≈2 pW at 633 nm and ≈4 nW at 1550 nm. The specific detectivity can reach 3.75 × 1013 Jones at 633 nm and 1.8 × 1010 Jones at 1550 nm. Furthermore, high-resolution broadband and polarized light imaging are successfully demonstrated. These findings provide more opportunities for developing next-generation photodetectors with comprehensive high performance.

Abstract Image

用于高性能、偏振敏感、宽带红外探测器的Bi2O2Se/Ta2NiSe5隧道异质结
自动驾驶和机器视觉等新技术不断推动光电探测器获得高响应、快速响应、低检测极限、偏振灵敏度和宽带光响应等综合高性能。二维范德华(vdW)异质结构由于其定制的能带对准和独特的物理性质而成为下一代光电探测器的有希望的候选者。本文提出了一种基于Bi2O2Se/Ta2NiSe5异质结的高性能光电探测器,该探测器通过隧道效应同时实现了高响应度(>103 a W−1)和快速响应时间(≈5µs)。该异质结器件具有令人印象深刻的灵敏度和低检测限,在633 nm处达到≈2 pW,在1550 nm处达到≈4 nW。比探测率在633 nm处可达3.75 × 1013 Jones,在1550 nm处可达1.8 × 1010 Jones。此外,还成功地展示了高分辨率宽带和偏振光成像。这些发现为开发具有全面高性能的下一代光电探测器提供了更多的机会。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
Advanced Electronic Materials
Advanced Electronic Materials NANOSCIENCE & NANOTECHNOLOGYMATERIALS SCIE-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
11.00
自引率
3.20%
发文量
433
期刊介绍: Advanced Electronic Materials is an interdisciplinary forum for peer-reviewed, high-quality, high-impact research in the fields of materials science, physics, and engineering of electronic and magnetic materials. It includes research on physics and physical properties of electronic and magnetic materials, spintronics, electronics, device physics and engineering, micro- and nano-electromechanical systems, and organic electronics, in addition to fundamental research.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信