{"title":"Bi2O2Se/Ta2NiSe5 Tunneling Heterojunction for High-Performance, Polarization-Sensitive, and Broadband Infrared Photodetector","authors":"Fang Yang, Yuanfang Yu, Xinglei Zhang, Zhihao Qu, Zhaofu Chen, Shizheng Wang, Yinan Wang, Ting Zheng, Weiwei Zhao, Junpeng Lu, Hongwei Liu","doi":"10.1002/aelm.202500115","DOIUrl":null,"url":null,"abstract":"New technologies such as autonomous driving, and machine vision keep pushing the photodetectors to acquire a comprehensive high performance including high responsivity, fast response, low detection limit, polarization sensitivity, and broadband photoresponse. 2D van der Waals (vdW) heterostructures have emerged as promising candidates for next-generation photodetectors due to their tailored band alignments and unique physical properties. In this work, a high-performance photodetector based on the Bi<sub>2</sub>O<sub>2</sub>Se/Ta<sub>2</sub>NiSe<sub>5</sub> heterojunction, which simultaneously achieves high responsivity (>10<sup>3</sup> A W<sup>−1</sup>) and fast response time (≈5 µs) through the tunneling effect is proposed. The heterojunction device exhibits impressive sensitivity with a low detection limit, achieving ≈2 pW at 633 nm and ≈4 nW at 1550 nm. The specific detectivity can reach 3.75 × 10<sup>13</sup> Jones at 633 nm and 1.8 × 10<sup>10</sup> Jones at 1550 nm. Furthermore, high-resolution broadband and polarized light imaging are successfully demonstrated. These findings provide more opportunities for developing next-generation photodetectors with comprehensive high performance.","PeriodicalId":110,"journal":{"name":"Advanced Electronic Materials","volume":"74 1","pages":""},"PeriodicalIF":5.3000,"publicationDate":"2025-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Electronic Materials","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1002/aelm.202500115","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
New technologies such as autonomous driving, and machine vision keep pushing the photodetectors to acquire a comprehensive high performance including high responsivity, fast response, low detection limit, polarization sensitivity, and broadband photoresponse. 2D van der Waals (vdW) heterostructures have emerged as promising candidates for next-generation photodetectors due to their tailored band alignments and unique physical properties. In this work, a high-performance photodetector based on the Bi2O2Se/Ta2NiSe5 heterojunction, which simultaneously achieves high responsivity (>103 A W−1) and fast response time (≈5 µs) through the tunneling effect is proposed. The heterojunction device exhibits impressive sensitivity with a low detection limit, achieving ≈2 pW at 633 nm and ≈4 nW at 1550 nm. The specific detectivity can reach 3.75 × 1013 Jones at 633 nm and 1.8 × 1010 Jones at 1550 nm. Furthermore, high-resolution broadband and polarized light imaging are successfully demonstrated. These findings provide more opportunities for developing next-generation photodetectors with comprehensive high performance.
期刊介绍:
Advanced Electronic Materials is an interdisciplinary forum for peer-reviewed, high-quality, high-impact research in the fields of materials science, physics, and engineering of electronic and magnetic materials. It includes research on physics and physical properties of electronic and magnetic materials, spintronics, electronics, device physics and engineering, micro- and nano-electromechanical systems, and organic electronics, in addition to fundamental research.