{"title":"Reliability analysis based on doubly-truncated and interval-censored data.","authors":"Pao-Sheng Shen, Huai-Man Li","doi":"10.1080/02664763.2024.2415412","DOIUrl":null,"url":null,"abstract":"<p><p>Field data provide important information on product reliability. Interval sampling is widely used for collection of field data, which typically report incident cases during a certain time period. Such sampling scheme induces doubly truncated (DT) data if the exact failure time is known. In many situations, the exact failure date is known only to fall within an interval, leading to doubly truncated and interval censored (DTIC) data. This article considers analysis of DTIC data under parametric failure time models. We consider a conditional likelihood approach and propose interval estimation for parameters and the cumulative distribution functions. Simulation studies show that the proposed method performs well for finite sample size.</p>","PeriodicalId":15239,"journal":{"name":"Journal of Applied Statistics","volume":"52 5","pages":"1128-1143"},"PeriodicalIF":1.2000,"publicationDate":"2024-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11951335/pdf/","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Applied Statistics","FirstCategoryId":"100","ListUrlMain":"https://doi.org/10.1080/02664763.2024.2415412","RegionNum":4,"RegionCategory":"数学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2025/1/1 0:00:00","PubModel":"eCollection","JCR":"Q2","JCRName":"STATISTICS & PROBABILITY","Score":null,"Total":0}
引用次数: 0
Abstract
Field data provide important information on product reliability. Interval sampling is widely used for collection of field data, which typically report incident cases during a certain time period. Such sampling scheme induces doubly truncated (DT) data if the exact failure time is known. In many situations, the exact failure date is known only to fall within an interval, leading to doubly truncated and interval censored (DTIC) data. This article considers analysis of DTIC data under parametric failure time models. We consider a conditional likelihood approach and propose interval estimation for parameters and the cumulative distribution functions. Simulation studies show that the proposed method performs well for finite sample size.
期刊介绍:
Journal of Applied Statistics provides a forum for communication between both applied statisticians and users of applied statistical techniques across a wide range of disciplines. These areas include business, computing, economics, ecology, education, management, medicine, operational research and sociology, but papers from other areas are also considered. The editorial policy is to publish rigorous but clear and accessible papers on applied techniques. Purely theoretical papers are avoided but those on theoretical developments which clearly demonstrate significant applied potential are welcomed. Each paper is submitted to at least two independent referees.