Woo Jin Baek;Joon Pyo Kim;Song Hyeon Kuk;Juhyuk Park;Hyun Soo Kim;Dae-Myeong Geum;Sang Hyeon Kim
{"title":"Field-Effect Passivation of GaN-Based Blue Micro-Light-Emitting Diodes","authors":"Woo Jin Baek;Joon Pyo Kim;Song Hyeon Kuk;Juhyuk Park;Hyun Soo Kim;Dae-Myeong Geum;Sang Hyeon Kim","doi":"10.1109/JEDS.2025.3552171","DOIUrl":null,"url":null,"abstract":"We demonstrate field-effect passivation (FEP) of GaN-based blue <inline-formula> <tex-math>$\\mu $ </tex-math></inline-formula> LEDs by incorporating an additional metal-oxide-semiconductor gate structure on the sidewalls. This approach allows for active control of surface band bending at the sidewalls, thereby modulating carrier trapping and de-trapping. We observe that applying a negative gate voltage <inline-formula> <tex-math>$(V_{G})$ </tex-math></inline-formula> facilitates electron de-trapping, leading to a reduction in surface recombination and a corresponding decrease in current, as evidenced by an enhanced external quantum efficiency (EQE). Conversely, applying a positive <inline-formula> <tex-math>$V_{G}$ </tex-math></inline-formula> results in the opposite effect.","PeriodicalId":13210,"journal":{"name":"IEEE Journal of the Electron Devices Society","volume":"13 ","pages":"303-307"},"PeriodicalIF":2.0000,"publicationDate":"2025-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10930472","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Journal of the Electron Devices Society","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10930472/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
We demonstrate field-effect passivation (FEP) of GaN-based blue $\mu $ LEDs by incorporating an additional metal-oxide-semiconductor gate structure on the sidewalls. This approach allows for active control of surface band bending at the sidewalls, thereby modulating carrier trapping and de-trapping. We observe that applying a negative gate voltage $(V_{G})$ facilitates electron de-trapping, leading to a reduction in surface recombination and a corresponding decrease in current, as evidenced by an enhanced external quantum efficiency (EQE). Conversely, applying a positive $V_{G}$ results in the opposite effect.
期刊介绍:
The IEEE Journal of the Electron Devices Society (J-EDS) is an open-access, fully electronic scientific journal publishing papers ranging from fundamental to applied research that are scientifically rigorous and relevant to electron devices. The J-EDS publishes original and significant contributions relating to the theory, modelling, design, performance, and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanodevices, optoelectronics, photovoltaics, power IC''s, and micro-sensors. Tutorial and review papers on these subjects are, also, published. And, occasionally special issues with a collection of papers on particular areas in more depth and breadth are, also, published. J-EDS publishes all papers that are judged to be technically valid and original.