{"title":"Research on the degradation of contact resistance of wire-spring contacts in different wear condition","authors":"Le Xu , Yuyao Zhao , Shujuan Wang , Ji Jiang","doi":"10.1016/j.microrel.2025.115721","DOIUrl":null,"url":null,"abstract":"<div><div>Electrical connectors are important components in electrical systems, responsible for the transmission and control of electrical signals. In the process of use, frictional wear occurs between the pins and sockets of the contactor in an electrical connector. This phenomenon results in an increase in contact resistance, which can further lead to system failures, so it is critical to ensure the stability of the performance of the contactor. In this paper, a commonly used specification of wire-spring contacts is investigated. Firstly, the mechanical properties of the component were analyzed. Subsequently, the contact component underwent vibration testing under various conditions at room temperature to identify the wear patterns associated with different vibration scenarios. Finally, using the experimental data, a physical model of frictional wear failure was developed for the contact component, enabling the determination of contact failure time as a function of vibration amplitude and frequency.</div></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"168 ","pages":"Article 115721"},"PeriodicalIF":1.6000,"publicationDate":"2025-03-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Reliability","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0026271425001349","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Electrical connectors are important components in electrical systems, responsible for the transmission and control of electrical signals. In the process of use, frictional wear occurs between the pins and sockets of the contactor in an electrical connector. This phenomenon results in an increase in contact resistance, which can further lead to system failures, so it is critical to ensure the stability of the performance of the contactor. In this paper, a commonly used specification of wire-spring contacts is investigated. Firstly, the mechanical properties of the component were analyzed. Subsequently, the contact component underwent vibration testing under various conditions at room temperature to identify the wear patterns associated with different vibration scenarios. Finally, using the experimental data, a physical model of frictional wear failure was developed for the contact component, enabling the determination of contact failure time as a function of vibration amplitude and frequency.
期刊介绍:
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.