Sinan Zou;Xing Zhao;Yuan Xue;Jianfeng Gao;Yan Cui;Jun Luo
{"title":"Extremely Low Switching Current STT-MRAM Device With Double Spin Transfer Torque","authors":"Sinan Zou;Xing Zhao;Yuan Xue;Jianfeng Gao;Yan Cui;Jun Luo","doi":"10.1109/LED.2025.3539311","DOIUrl":null,"url":null,"abstract":"In this work, we demonstrate an STT-MRAM device with double reference layer that shows extremely low critical switching current density. A synthetic antiferromagnetic (SAF) layer [Co/Pt]n/Ru/[Co/Pt]m is used as the upper reference layer in the STT-MTJ device with perpendicular magnetic anisotropy (PMA) which can apply extra spin transfer torque to the free layer in the process of data writing. The ac R-I experimental results show that when the magnetization directions of upper and nether reference layer are antiparallel state, the JC is only 1.230 MA/cm2 for AP2P and 1.867 MA/cm2 for P2AP, when the pulse width is 10ns, which is more than <inline-formula> <tex-math>$5\\times $ </tex-math></inline-formula> lower than the classical single reference layer STT-MTJ device with the close thermal stability. Our work provides a new way to achieve the ultra-low power STT-MRAM for IoT application.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"46 4","pages":"584-587"},"PeriodicalIF":4.1000,"publicationDate":"2025-02-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10876213/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
In this work, we demonstrate an STT-MRAM device with double reference layer that shows extremely low critical switching current density. A synthetic antiferromagnetic (SAF) layer [Co/Pt]n/Ru/[Co/Pt]m is used as the upper reference layer in the STT-MTJ device with perpendicular magnetic anisotropy (PMA) which can apply extra spin transfer torque to the free layer in the process of data writing. The ac R-I experimental results show that when the magnetization directions of upper and nether reference layer are antiparallel state, the JC is only 1.230 MA/cm2 for AP2P and 1.867 MA/cm2 for P2AP, when the pulse width is 10ns, which is more than $5\times $ lower than the classical single reference layer STT-MTJ device with the close thermal stability. Our work provides a new way to achieve the ultra-low power STT-MRAM for IoT application.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.