Strain-Enhanced Responsivity of Scalable and Flexible Diamond UV Detector

IF 4.1 2区工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Electron Device Letters Pub Date : 2025-01-27 DOI:10.1109/LED.2025.3535477

Jixiang Jing;Yumeng Luo;Yicheng Wang;Zhongqiang Wang;Qi Wang;Kwai Hei Li;Zhiqin Chu

引用次数: 0

Abstract

In this letter, we present scalable and flexible diamond UV detectors. A 2-inch, 1-

$\mu $

m-thick diamond film is exfoliated from its heteroepitaxial silicon substrate and transferred to a soft PDMS substrate, forming the foundation for the flexible detector. Measurement under strains of 0%, 0.6%, and 1.2% reveals a decrease in the bandgap of diamond film from 5.31 eV to 5.18 eV and 5.06 eV, respectively. This strain-induced narrowing of the bandgap improves the responsivity of diamond detectors under UV illumination. The elastic strain engineering on diamonds, being simple and effective, provides a new route to improve the performance of diamond UV detectors, promising to accelerate the development of next-generation flexible diamond electronics.

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来源期刊

IEEE Electron Device Letters 工程技术-工程：电子与电气

CiteScore

8.20

自引率

10.20%

发文量

551

审稿时长

1.4 months

期刊介绍： IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.