Boxing Qian , Yu Wang , Wei Shao , Youzhuo Li , Xuan Wei
{"title":"Deformation measurement of mesh-hole structure based on digital image correlation","authors":"Boxing Qian , Yu Wang , Wei Shao , Youzhuo Li , Xuan Wei","doi":"10.1016/j.measurement.2025.117301","DOIUrl":null,"url":null,"abstract":"<div><div>The mechanical properties of structures after lightweight design should be taken seriously. However, after optimization, it is often difficult to measure its mechanical properties due to the complex structures of mesh-hole. Based on digital image correlation (DIC) and binocular stereo vision, a full-field deformation measurement method for the surface of mesh-hole structures under stress is proposed. Firstly, by utilizing the grayscale information entropy of the foreground and background, the speckle calculation region on the reference image is automatically extracted. It avoids ineffective calculation of non-measured areas. Secondly, for the complex deformation of structure with holes, two second-order deformation parameters are introduced to describe the grayscale mapping between the reference subset and the deformed subset. The corresponding correlation matching algorithm is also improved. Thus, it ensures computational efficiency while enhancing matching accuracy. Finally, the mesh-hole structure is printed with polylactic acid (PLA) material, and its compression deformation is measured. The results indicate that the method proposed can be used for rapid tests of the mechanical properties of lightweight structures.</div></div>","PeriodicalId":18349,"journal":{"name":"Measurement","volume":"251 ","pages":"Article 117301"},"PeriodicalIF":5.2000,"publicationDate":"2025-03-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Measurement","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0263224125006608","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
The mechanical properties of structures after lightweight design should be taken seriously. However, after optimization, it is often difficult to measure its mechanical properties due to the complex structures of mesh-hole. Based on digital image correlation (DIC) and binocular stereo vision, a full-field deformation measurement method for the surface of mesh-hole structures under stress is proposed. Firstly, by utilizing the grayscale information entropy of the foreground and background, the speckle calculation region on the reference image is automatically extracted. It avoids ineffective calculation of non-measured areas. Secondly, for the complex deformation of structure with holes, two second-order deformation parameters are introduced to describe the grayscale mapping between the reference subset and the deformed subset. The corresponding correlation matching algorithm is also improved. Thus, it ensures computational efficiency while enhancing matching accuracy. Finally, the mesh-hole structure is printed with polylactic acid (PLA) material, and its compression deformation is measured. The results indicate that the method proposed can be used for rapid tests of the mechanical properties of lightweight structures.
期刊介绍:
Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.