{"title":"Dependability and Protection of Transformer Models Against Soft Errors on Text Embeddings","authors":"Zhen Gao;Shuang Liu;Pedro Reviriego;Shanshan Liu;Fabrizio Lombardi","doi":"10.1109/TDMR.2024.3478753","DOIUrl":null,"url":null,"abstract":"Transformers have achieved remarkable success in diverse fields such as Natural Language Processing (NLP) and computer vision (CV). For pre-trained Transformer models involving text processing, embedding representations are important parameters, incurring a large volume of memory. Soft errors on embedding vectors can lead to incorrect inputs to Transformers, and if not corrected in time, accumulated errors may produce undesirable outcomes. This paper considers the dependability of text related Transformer models to accumulated errors on embedding parameters and takes three typical models in different applications as case studies: BERT based sentence emotion classification, T5 based text summarization, and CLIP based image classification. We first evaluate the dependability of the three models by injecting bit errors on embedding parameters; only errors on a few critical bits affect model performance. Based on this finding, we first propose an efficient selective protection for embedding parameters with small values, and then through scaling, we extend the scheme for models with large embedding parameters. Extensive simulation results show that the proposed protection scheme can effectively remove the impact of soft errors on task performance. In particular, the complexity overhead of the proposed scheme is negligible, and the additional memory overhead as encountered in the SEC scheme is avoided.","PeriodicalId":448,"journal":{"name":"IEEE Transactions on Device and Materials Reliability","volume":"25 1","pages":"54-65"},"PeriodicalIF":2.5000,"publicationDate":"2024-10-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Device and Materials Reliability","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10714418/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Transformers have achieved remarkable success in diverse fields such as Natural Language Processing (NLP) and computer vision (CV). For pre-trained Transformer models involving text processing, embedding representations are important parameters, incurring a large volume of memory. Soft errors on embedding vectors can lead to incorrect inputs to Transformers, and if not corrected in time, accumulated errors may produce undesirable outcomes. This paper considers the dependability of text related Transformer models to accumulated errors on embedding parameters and takes three typical models in different applications as case studies: BERT based sentence emotion classification, T5 based text summarization, and CLIP based image classification. We first evaluate the dependability of the three models by injecting bit errors on embedding parameters; only errors on a few critical bits affect model performance. Based on this finding, we first propose an efficient selective protection for embedding parameters with small values, and then through scaling, we extend the scheme for models with large embedding parameters. Extensive simulation results show that the proposed protection scheme can effectively remove the impact of soft errors on task performance. In particular, the complexity overhead of the proposed scheme is negligible, and the additional memory overhead as encountered in the SEC scheme is avoided.
期刊介绍:
The scope of the publication includes, but is not limited to Reliability of: Devices, Materials, Processes, Interfaces, Integrated Microsystems (including MEMS & Sensors), Transistors, Technology (CMOS, BiCMOS, etc.), Integrated Circuits (IC, SSI, MSI, LSI, ULSI, ELSI, etc.), Thin Film Transistor Applications. The measurement and understanding of the reliability of such entities at each phase, from the concept stage through research and development and into manufacturing scale-up, provides the overall database on the reliability of the devices, materials, processes, package and other necessities for the successful introduction of a product to market. This reliability database is the foundation for a quality product, which meets customer expectation. A product so developed has high reliability. High quality will be achieved because product weaknesses will have been found (root cause analysis) and designed out of the final product. This process of ever increasing reliability and quality will result in a superior product. In the end, reliability and quality are not one thing; but in a sense everything, which can be or has to be done to guarantee that the product successfully performs in the field under customer conditions. Our goal is to capture these advances. An additional objective is to focus cross fertilized communication in the state of the art of reliability of electronic materials and devices and provide fundamental understanding of basic phenomena that affect reliability. In addition, the publication is a forum for interdisciplinary studies on reliability. An overall goal is to provide leading edge/state of the art information, which is critically relevant to the creation of reliable products.