Microstructure-modulated conductive filaments in Ruddlesden-Popper perovskite-based memristors and their application in artificial synapses

IF 10 2区 材料科学 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY
Fu-Chiao Wu , Zi-Ming Su , Yu-Chieh Hsu , Wei-Yang Chou , Wei-Chih Lai , Chin-Chun Tsai , Horng-Long Cheng
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引用次数: 0

Abstract

Low-dimensional, lead-free perovskite-based electronic/optoelectronic devices exhibit the advantages of stability and nontoxicity. However, their electrical performance is often lower than that of their three-dimensional, lead-based counterparts. Hence, understanding the correlations between microstructural features and electrical characteristics of low-dimensional, lead-free perovskite-based devices is essential for enhancing device performance. In this study, a two-dimensional Ruddlesden-Popper type perovskite, phenylethylammonium tin iodide (PEA2SnI4), was selected as the active material. Various PEAI:SnI2 blending ratios and molar concentrations were adopted to fabricate PEA2SnI4-based memristors. The absorption spectra of PEA2SnI4 thin films from diverse process conditions show significant differences, which are rarely discussed in the literature. With the aid of theoretical calculations, we found that the variations in absorption spectra reflect that the PEA2SnI4 specimens with low PEAI loading have short crystallite size perpendicular to the substrate and deficiency of organic components in lattice structures, slowing the formation and disruption of silver (Ag) conductive filaments (CFs) of devices. The PEA2SnI4 specimens from high molar concentration possess long and short crystallite sizes perpendicular and parallel to the substrate, respectively, leading to efficient formation and disruption of Ag CFs and a large resistive switching window of devices, but weakening the interaction between adjacent PEA2SnI4 layers, causing decreased operational stability of devices. Cross-sectional scanning transmission electron microscopy combined with energy-dispersive X-ray spectroscopy was employed to confirm Ag CF formation. As synaptic devices, these PEA2SnI4-based memristors can perform spike-time- and spike-number-dependent plasticity, microstructure-dependent synaptic characteristics, and opposite synaptic behaviors at high and low resistance states. By engineering microstructural features, low-dimensional, lead-free perovskite-based memristors with improved electrical performance or a variety of synaptic behaviors can be achieved.

Abstract Image

Abstract Image

Ruddlesden-Popper钙钛矿基忆阻器中微结构调制导电丝及其在人工突触中的应用
低维、无铅钙钛矿基电子/光电器件具有稳定性和无毒性的优点。然而,它们的电性能往往低于三维的铅基材料。因此,了解低维无铅钙钛矿基器件的微结构特征和电特性之间的相关性对于提高器件性能至关重要。本研究选择二维Ruddlesden-Popper型钙钛矿苯乙基碘化锡铵(PEA2SnI4)作为活性材料。采用不同的pea2sni2混合比例和摩尔浓度制备pea2sni4基忆阻器。不同工艺条件下PEA2SnI4薄膜的吸收光谱表现出显著差异,这在文献中很少讨论。通过理论计算,我们发现吸收光谱的变化反映了低PEAI负载的PEA2SnI4样品垂直于衬底的晶粒尺寸短,晶格结构中缺乏有机成分,减缓了器件银(Ag)导电细丝(CFs)的形成和破坏。高摩尔浓度的PEA2SnI4样品分别具有垂直于衬底和平行于衬底的长晶和短晶尺寸,这使得Ag CFs的形成和破坏效率高,器件的电阻开关窗口大,但削弱了相邻PEA2SnI4层之间的相互作用,导致器件的运行稳定性下降。采用横断面扫描透射电镜结合能量色散x射线能谱法证实Ag - CF的形成。作为突触器件,这些基于pea2sni4的记忆电阻器可以在高电阻和低电阻状态下表现出与峰值时间和峰值数量相关的可塑性,与微结构相关的突触特性以及相反的突触行为。通过工程微观结构特征,可以实现具有改进电性能或各种突触行为的低维无铅钙钛矿基忆阻器。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Materials Today Physics
Materials Today Physics Materials Science-General Materials Science
CiteScore
14.00
自引率
7.80%
发文量
284
审稿时长
15 days
期刊介绍: Materials Today Physics is a multi-disciplinary journal focused on the physics of materials, encompassing both the physical properties and materials synthesis. Operating at the interface of physics and materials science, this journal covers one of the largest and most dynamic fields within physical science. The forefront research in materials physics is driving advancements in new materials, uncovering new physics, and fostering novel applications at an unprecedented pace.
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