Density matrix reconstruction using a Hong–Ou–Mandel quantum interferometer

IF 3.1 3区 物理与天体物理 Q2 Engineering
Optik Pub Date : 2025-03-10 DOI:10.1016/j.ijleo.2025.172278
Vitaly Sukharenko, Roger Dorsinville
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引用次数: 0

Abstract

We provide a comprehensive analysis of the reconstruction of the density matrix for entangled photon pairs, utilizing polarization measurements within a Hong–Ou–Mandel (HOM) interference framework. The purpose of this study is to develop a new efficient approach for quantum state characterization, leveraging quantum interference to reduce wave dispersion and utilizing the maximum likelihood method for density matrix reconstruction. The model involves projecting the entangled photons onto a set of sixteen unique polarization states, enabling the observation of detailed quantum interference patterns. We use these patterns to reconstruct the density matrix, revealing the system’s quantum state and degree of entanglement. Our findings demonstrate the effectiveness of this method in accurately characterizing the quantum state of light, while leveraging quantum interference to reduce wave dispersion and improve signal quality and resolution. Our study underscores the effectiveness of this method in accurately characterizing the quantum state of light and highlights the essential role of precise density matrix reconstruction in a Hong–Ou–Mandel interferometer without the use of polarizers. The methodology and results presented lay a strong foundation for further research, with implications for improving measurement accuracy and exploring more complex quantum systems in various quantum information applications.
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来源期刊
Optik
Optik 物理-光学
CiteScore
6.90
自引率
12.90%
发文量
1471
审稿时长
46 days
期刊介绍: Optik publishes articles on all subjects related to light and electron optics and offers a survey on the state of research and technical development within the following fields: Optics: -Optics design, geometrical and beam optics, wave optics- Optical and micro-optical components, diffractive optics, devices and systems- Photoelectric and optoelectronic devices- Optical properties of materials, nonlinear optics, wave propagation and transmission in homogeneous and inhomogeneous materials- Information optics, image formation and processing, holographic techniques, microscopes and spectrometer techniques, and image analysis- Optical testing and measuring techniques- Optical communication and computing- Physiological optics- As well as other related topics.
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