Device edge termination effects on TDDB in galvanic isolators based on polymeric dielectrics

IF 1.6 4区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

Microelectronics Reliability Pub Date : 2025-03-12 DOI:10.1016/j.microrel.2025.115670

Matteo Greatti , Jurij L. Mazzola , Lorenzo Cantù , Marco Salina , Fabrizio Speroni , Michele Lauria , Francesco Guzzi , Donata Asnaghi , Dario Paci , Vincenzo Marano , Alessandro Spinelli , Christian Monzio Compagnoni , Gerardo Malavena

引用次数: 0

Abstract

We present an investigation on the impact of device edge termination on Time-Dependent Dielectric Breakdown (TDDB) in galvanic isolators based on polymeric dielectrics. By means of experimental and numerical analyses, we highlight that electrode thickness and device passivation are important design elements to limit the impact of electric field intensification at device on TDDB and prolong device lifetime. Results point out key aspects to consider to push the performance and the reliability of modern galvanic isolators to their ultimate limits.

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基于聚合物介质的电隔离器中器件边缘终止对TDDB的影响

本文研究了基于聚合物介质的电隔离器中器件边缘终止对时间相关介质击穿（TDDB）的影响。通过实验和数值分析，我们强调了电极厚度和器件钝化是限制器件处电场强度对TDDB影响和延长器件寿命的重要设计因素。结果指出了将现代电隔离器的性能和可靠性推向极限需要考虑的关键方面。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Microelectronics Reliability 工程技术-工程：电子与电气

CiteScore

3.30

自引率

12.50%

发文量

342

审稿时长

68 days

期刊介绍： Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.