{"title":"A Highly Robust Integrated Gate Driver Based on Organic TFTs for Active-Matrix Displays","authors":"Wanming Wu;Chuanke Chen;Chunyu Zhang;Chen Gu;Yinzhi Tang;Shipeng Wang;Mengwen Yan;Qingding Tong;Di Geng;Ling Li","doi":"10.1109/JEDS.2025.3542951","DOIUrl":null,"url":null,"abstract":"A highly robust integrated gate driver based on organic thin-film transistors (OTFTs) is proposed that effectively addresses the output degradation caused by depletion-mode operation, instability and variation. The series-connected two-transistor structures and the inverters generate positive gateto- source voltages for internal nodes, which eliminate the leakage current and voltage ripples in depletion-mode operation and extend the support threshold voltage (<inline-formula> <tex-math>$V_{TH}$ </tex-math></inline-formula>) range. The simulation waveforms of the 538th stage have no degradation, considering the <inline-formula> <tex-math>$\\Delta V_{TH}$ </tex-math></inline-formula> range from 1.18 to -0.53 V for single-gate (SG) OTFT and that from 2.13 to -8.07 V for dual-gate (DG) OTFT. The fabricated gate drivers generate stable scan signals with almost negligible voltage ripples for SG- and DG-OTFT with <inline-formula> <tex-math>$V_{TH}$ </tex-math></inline-formula> of +7.9 and +1.8 V, respectively. In a 5.8-inch AMOLED panel (resolution: 538×302), the circuit can operate at a frame rate range from 1 to 45 Hz, driven by clocks with a frequency of 12.5 kHz and a swing from 0 to -15 V.","PeriodicalId":13210,"journal":{"name":"IEEE Journal of the Electron Devices Society","volume":"13 ","pages":"128-133"},"PeriodicalIF":2.0000,"publicationDate":"2025-02-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10891473","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Journal of the Electron Devices Society","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10891473/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
A highly robust integrated gate driver based on organic thin-film transistors (OTFTs) is proposed that effectively addresses the output degradation caused by depletion-mode operation, instability and variation. The series-connected two-transistor structures and the inverters generate positive gateto- source voltages for internal nodes, which eliminate the leakage current and voltage ripples in depletion-mode operation and extend the support threshold voltage ($V_{TH}$ ) range. The simulation waveforms of the 538th stage have no degradation, considering the $\Delta V_{TH}$ range from 1.18 to -0.53 V for single-gate (SG) OTFT and that from 2.13 to -8.07 V for dual-gate (DG) OTFT. The fabricated gate drivers generate stable scan signals with almost negligible voltage ripples for SG- and DG-OTFT with $V_{TH}$ of +7.9 and +1.8 V, respectively. In a 5.8-inch AMOLED panel (resolution: 538×302), the circuit can operate at a frame rate range from 1 to 45 Hz, driven by clocks with a frequency of 12.5 kHz and a swing from 0 to -15 V.
期刊介绍:
The IEEE Journal of the Electron Devices Society (J-EDS) is an open-access, fully electronic scientific journal publishing papers ranging from fundamental to applied research that are scientifically rigorous and relevant to electron devices. The J-EDS publishes original and significant contributions relating to the theory, modelling, design, performance, and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanodevices, optoelectronics, photovoltaics, power IC''s, and micro-sensors. Tutorial and review papers on these subjects are, also, published. And, occasionally special issues with a collection of papers on particular areas in more depth and breadth are, also, published. J-EDS publishes all papers that are judged to be technically valid and original.