G. Janod , L. Chachay , J. Schoenleber , Y. Avenas , D. Bouvard , R. Daudin , J.-M. Missiaen , M.-P. Gigandet , J.-Y. Hihn , R. Khazaka
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引用次数: 0
Abstract
Driven by applications in the field of electric mobility, power electronics face the challenge of operating at higher power densities. Power modules with double-side cooling appear as a promising solution, but they are difficult to manufacture. Electrodeposited copper allows flexibility in module design. This paper evaluates a die attachment method based on thermocompression of electrodeposited porous copper films. Films are fabricated using the DHBT (Dynamic Hydrogen Bubble Template) technique. A characterization study of this solution, including its behavior after thermal ageing, is carried out using thermal impedance and shear stress measurements.
期刊介绍:
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.