Experimental and numerical analysis of cyclic ratchetting and low cycle fatigue behaviour in meander-shaped interconnects for stretchable electronics applications

IF 1.6 4区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

Microelectronics Reliability Pub Date : 2025-03-01 DOI:10.1016/j.microrel.2025.115632

Amir Sarikhan Khelejani , Amir Jahanshahi , Mahnaz Shamshirsaz

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Abstract

Stretchable interconnect is a crucial component of a wearable device, responsible for establishing electrical connections throughout the system. Among various technologies, thin film-based interconnects provide superior electrical conductivity comparable to bulk metals, enabling high-quality signals in diverse wearable applications. Nevertheless, their relatively low mechanical fatigue life remains a significant challenge. Research has shown that flexible polymer-supported interconnects exhibit improved fatigue life compared to non-supported counterparts.

Albeit widespread adoption of thin film-based stretchable tracks, underlying physical principles governing their fatigue life is not thoroughly studied. In this work, stretchable interconnects are fabricated and analysed using a cost-effective method suitable for mass fabrication. This study focuses on modelling of the stretchable interconnects using FEM under both static and dynamic loadings to discover the significant role of flexible polymer in increasing the cyclic fatigue life. Polyimide (PI)-supported interconnects show a major decrease (~ 20 %) in maximum strain under static load compared to non-supported interconnects. It has been demonstrated that under dynamic loading, non-supported interconnects fail mostly based on ratcheting strain, whereas low cycle fatigue (LCF) governs the failure mechanism of PI supported tracks. The latter happens due to the beneficial residual stress imposed by the flexible support layer. The findings are supported by characterizing the experimentally fabricated stretchable interconnects.

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来源期刊

Microelectronics Reliability 工程技术-工程：电子与电气

CiteScore

3.30

自引率

12.50%

发文量

342

审稿时长

68 days

期刊介绍： Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.