Laser voltage probing and simulation of a flip-flop with undesired quasi-static switching

IF 1.6 4区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

Microelectronics Reliability Pub Date : 2025-02-28 DOI:10.1016/j.microrel.2025.115637

A.A. Merassi , T. Melis

引用次数: 0

Abstract

The measurement of quasi-static undesired switching in flip-flop output using laser voltage techniques is critical due to the low frequencies involved, which are often incompatible with most laser voltage probing systems. Additionally, a minimum signal repeatability is required to trigger the signal for accurate measurement.

To overcome these limitations and achieve a full characterization, this study utilizes the fault simulation techniques. The objective of this work is to build a model of the failing flip-flop that matches laser voltage probing measurements, providing a deeper understanding of the failure mechanism of this cell.

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来源期刊

Microelectronics Reliability 工程技术-工程：电子与电气

CiteScore

3.30

自引率

12.50%

发文量

342

审稿时长

68 days

期刊介绍： Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.