Demonstration of Low-Power Three-Dimensional CMOS Inverters Based on Si p-Tunnel FET and ITO n-FET

IF 4.1 2区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Anyu Tong;Kaifeng Wang;Qianlan Hu;Zhiyu Wang;Xiong Xiong;Shiwei Yan;Shenwu Zhu;Qijun Li;Yongqin Wu;Ye Ren;Weihai Bu;Qianqian Huang;Yanqing Wu;Ru Huang
{"title":"Demonstration of Low-Power Three-Dimensional CMOS Inverters Based on Si p-Tunnel FET and ITO n-FET","authors":"Anyu Tong;Kaifeng Wang;Qianlan Hu;Zhiyu Wang;Xiong Xiong;Shiwei Yan;Shenwu Zhu;Qijun Li;Yongqin Wu;Ye Ren;Weihai Bu;Qianqian Huang;Yanqing Wu;Ru Huang","doi":"10.1109/LED.2025.3528045","DOIUrl":null,"url":null,"abstract":"In this work, low-power CMOS inverter and 5-stage ring oscillator (RO) are demonstrated based on heterogeneous 3D integration of vertically stacked FEOL p-type silicon tunnel FET (TFET) and BEOL n-type indium-tin-oxide (ITO) FET. Owing to the low off-state current of both p-type and n-type FET, our ITO/TFET heterogeneous 3D integrated CMOS inverters show a low static power of 4.83 pW at <inline-formula> <tex-math>${\\text{V}}_{\\text {dd}}=1$ </tex-math></inline-formula> V and a high voltage gain of 522 V/V at <inline-formula> <tex-math>${\\text{V}}_{\\text {dd}}=2.5$ </tex-math></inline-formula> V, among the best values in reported amorphous oxide semiconductors (AOS) CMOS devices. Meanwhile, we also verified the functionality of logic circuits including 4T-SRAM cell and 5-stage RO based on our ITO/TFET heterogeneous 3D integrated CMOS inverters, and our 5-stage RO achieved a low propagation delay of 30 ns/stage, which is also the lowest value among AOS and TFET related CMOS devices.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"46 3","pages":"512-515"},"PeriodicalIF":4.1000,"publicationDate":"2025-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10836929/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

Abstract

In this work, low-power CMOS inverter and 5-stage ring oscillator (RO) are demonstrated based on heterogeneous 3D integration of vertically stacked FEOL p-type silicon tunnel FET (TFET) and BEOL n-type indium-tin-oxide (ITO) FET. Owing to the low off-state current of both p-type and n-type FET, our ITO/TFET heterogeneous 3D integrated CMOS inverters show a low static power of 4.83 pW at ${\text{V}}_{\text {dd}}=1$ V and a high voltage gain of 522 V/V at ${\text{V}}_{\text {dd}}=2.5$ V, among the best values in reported amorphous oxide semiconductors (AOS) CMOS devices. Meanwhile, we also verified the functionality of logic circuits including 4T-SRAM cell and 5-stage RO based on our ITO/TFET heterogeneous 3D integrated CMOS inverters, and our 5-stage RO achieved a low propagation delay of 30 ns/stage, which is also the lowest value among AOS and TFET related CMOS devices.
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来源期刊
IEEE Electron Device Letters
IEEE Electron Device Letters 工程技术-工程:电子与电气
CiteScore
8.20
自引率
10.20%
发文量
551
审稿时长
1.4 months
期刊介绍: IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.
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