Superlattice Si/SiC APD with improved photo-sensitivity and stability: Application as low noise single photon detector

IF 3.1 3区 物理与天体物理 Q2 Engineering
Optik Pub Date : 2025-02-12 DOI:10.1016/j.ijleo.2025.172256
Debraj Modak , Saunak Bhattacharya , Karabi Ganguly , Indranath Sarkar , Moumita Mukherjee , Abhijit Kundu
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引用次数: 0

Abstract

This study reports the superiority of superlattice Si/SiC Avalanche Photodiode (APD) over its flat profile Si and SiCcounterparts. A large signal quantum corrected drift-diffusion (LSQC-DD) model is developed and used for the electro optical characteristic studies of the devices for application in UV detection. The effect of charge bump in the optimized doping profile near the metallurgical junction of the Device Under Test (DUT) is studied and reported for the first time in detailed. These results in the betterment of quantum efficiency compared to its flat profile counterpart (95 % vs.91 %). This study also reports the suitability of 3 × 3 array based APD photo sensors in terms of photo responsivity and quantum efficiency. Significant Noise reduction in case of Si/SiC superlattice devices would open its application possibility as low noise single photon detector. The validity of the indigenously developed simulator is established through experimental verification. Fabrication feasibility of the new class of superlattice APD is presented. To the best of authors' knowledge this is the first report on superlattice Si/SiC APD as single photon UV detector.
提高光敏性和稳定性的超晶格Si/SiC APD:作为低噪声单光子探测器的应用
本研究报告了超晶格Si/SiC雪崩光电二极管(APD)相对于其平面型Si和SiC对应物的优越性。建立了大信号量子校正漂移扩散(LSQC-DD)模型,并将其应用于紫外检测器件的电光特性研究。本文首次详细研究和报道了在被测器件(Device Under Test, DUT)冶金结附近的优化掺杂分布中电荷颠簸的影响。这些结果在量子效率的改善与其平剖面对应(95 % vs.91 %)。本研究还报道了基于3 × 3阵列的APD光传感器在光响应性和量子效率方面的适用性。硅/碳化硅超晶格器件的显著降噪将打开其作为低噪声单光子探测器应用的可能性。通过实验验证了自主开发的仿真器的有效性。提出了制备新型超晶格APD的可行性。据作者所知,这是关于超晶格Si/SiC APD作为单光子紫外探测器的第一篇报道。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Optik
Optik 物理-光学
CiteScore
6.90
自引率
12.90%
发文量
1471
审稿时长
46 days
期刊介绍: Optik publishes articles on all subjects related to light and electron optics and offers a survey on the state of research and technical development within the following fields: Optics: -Optics design, geometrical and beam optics, wave optics- Optical and micro-optical components, diffractive optics, devices and systems- Photoelectric and optoelectronic devices- Optical properties of materials, nonlinear optics, wave propagation and transmission in homogeneous and inhomogeneous materials- Information optics, image formation and processing, holographic techniques, microscopes and spectrometer techniques, and image analysis- Optical testing and measuring techniques- Optical communication and computing- Physiological optics- As well as other related topics.
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