A Parallel Computing Scheme Utilizing Memristor Crossbars for Fast Corner Detection and Rotation Invariance in the ORB Algorithm

IF 3.6 2区 计算机科学 Q2 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Qinghui Hong;Haoyou Jiang;Pingdan Xiao;Sichun Du;Tao Li
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引用次数: 0

Abstract

The Oriented FAST and Rotated BRIEF (ORB) algorithm plays a crucial role in rapidly extracting image keypoints. However, in the domain of high-frame-rate real-time applications, the algorithm faces challenges of the speed and computational efficiency with the increase in both the size and quantity of images. To address this issue, an ORB algorithm accelerator based on a computing-in-memory (CIM) circuit is firstly proposed in this paper, which replaces the iterative calculations in traditional methods with one-step parallel analog computation. The proposed accelerator improves algorithm computational efficiency through CIM technology and enhances algorithm speed through parallel computation. Simulation demonstrate that the proposed method exhibits an average processing speed 22 $\boldsymbol{\times}$ faster than traditional methods and obtains more uniform corners distribution in large-scale images.
定向快速旋转简明算法(ORB)在快速提取图像关键点方面起着至关重要的作用。然而,在高帧率实时应用领域,随着图像大小和数量的增加,该算法在速度和计算效率方面面临挑战。针对这一问题,本文首先提出了一种基于内存计算(CIM)电路的 ORB 算法加速器,它以一步并行模拟计算取代了传统方法中的迭代计算。所提出的加速器通过 CIM 技术提高了算法计算效率,并通过并行计算提高了算法速度。仿真表明,所提方法的平均处理速度比传统方法快 22 倍,并能在大规模图像中获得更均匀的角分布。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
IEEE Transactions on Computers
IEEE Transactions on Computers 工程技术-工程:电子与电气
CiteScore
6.60
自引率
5.40%
发文量
199
审稿时长
6.0 months
期刊介绍: The IEEE Transactions on Computers is a monthly publication with a wide distribution to researchers, developers, technical managers, and educators in the computer field. It publishes papers on research in areas of current interest to the readers. These areas include, but are not limited to, the following: a) computer organizations and architectures; b) operating systems, software systems, and communication protocols; c) real-time systems and embedded systems; d) digital devices, computer components, and interconnection networks; e) specification, design, prototyping, and testing methods and tools; f) performance, fault tolerance, reliability, security, and testability; g) case studies and experimental and theoretical evaluations; and h) new and important applications and trends.
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