Opposing Mean Error Compensation for Accuracy Enhancement in Analog Compute-in-Memory With Resistive Switching Devices

IF 2.9 2区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Wei-Hsing Huang;Woocheol Lee;Joong Sik Kim;Won-Tae Koo;Dong Ik Suh;Seho Lee;Jaeyun Yi;Seon Yong Cha;Shimeng Yu
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引用次数: 0

Abstract

Analog compute-in-memory (ACiM) systems show promise for energy-efficient AI inference, but their performance is hindered by variations in conductance, resulting in reduced accuracy. This work investigates the impact of mean error, which represents the discrepancy between actual conductance values and their intended targets from the measured distribution of 256 kb analog resistive switching cells, on the accuracy of neural network models. We propose opposing mean error compensation (OMEC), a technique that mitigates these errors without necessitating alterations to the memory device. Through simulations, we illustrate that adjusting weight targets can lead to a remarkable improvement in the inference accuracy, elevating it from a mere 12.59% to an impressive 90.65%, without modifying the memory device.
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来源期刊
IEEE Transactions on Electron Devices
IEEE Transactions on Electron Devices 工程技术-工程:电子与电气
CiteScore
5.80
自引率
16.10%
发文量
937
审稿时长
3.8 months
期刊介绍: IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.
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