{"title":"Nanostructuring of thin silver films by Ar cluster ions","authors":"D.S. Kireev , O.A. Streletskiy , A.A. Tatarintsev , D.R. Bessmertny , M.V. Samodelova , N.R. Yarenkov , A.E. Ieshkin","doi":"10.1016/j.tsf.2024.140578","DOIUrl":null,"url":null,"abstract":"<div><div>In this work, we studied the formation of silver nanoparticles on silicon substrates by irradiating thin silver films with Ar<sup>+</sup><sub>1000</sub> cluster ions with an energy of 10 keV. The topography of the film surface was studied using scanning electron microscopy. The dependence of the particle size and their surface density on the ion fluence was described, which opens a way for controlling the geometric parameters of the particles. Particle formation was considered as a result of two competing processes: sputtering and surface migration of the film atoms. Irradiation with cluster ions at oblique incidence leaded to formation of the particles of elongated shape, with the particle height being comparable to the initial film thickness. Applicability of the particles to surface enhanced Raman spectroscopy was characterized using the dye rhodamine 6 G.</div></div>","PeriodicalId":23182,"journal":{"name":"Thin Solid Films","volume":"809 ","pages":"Article 140578"},"PeriodicalIF":2.0000,"publicationDate":"2025-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Thin Solid Films","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0040609024003791","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, COATINGS & FILMS","Score":null,"Total":0}
引用次数: 0
Abstract
In this work, we studied the formation of silver nanoparticles on silicon substrates by irradiating thin silver films with Ar+1000 cluster ions with an energy of 10 keV. The topography of the film surface was studied using scanning electron microscopy. The dependence of the particle size and their surface density on the ion fluence was described, which opens a way for controlling the geometric parameters of the particles. Particle formation was considered as a result of two competing processes: sputtering and surface migration of the film atoms. Irradiation with cluster ions at oblique incidence leaded to formation of the particles of elongated shape, with the particle height being comparable to the initial film thickness. Applicability of the particles to surface enhanced Raman spectroscopy was characterized using the dye rhodamine 6 G.
期刊介绍:
Thin Solid Films is an international journal which serves scientists and engineers working in the fields of thin-film synthesis, characterization, and applications. The field of thin films, which can be defined as the confluence of materials science, surface science, and applied physics, has become an identifiable unified discipline of scientific endeavor.