E.F.M. El-Zaidia , A.A.A. Darwish , Saleem I. Qashou , H.A.M. Ali
{"title":"Relevance of linear and nonlinear optical properties of Erythrosine B thin films for photonic application","authors":"E.F.M. El-Zaidia , A.A.A. Darwish , Saleem I. Qashou , H.A.M. Ali","doi":"10.1016/j.tsf.2025.140602","DOIUrl":null,"url":null,"abstract":"<div><div>This study investigates the structural and optical properties of Erythrosine B thin films. The films were fabricated through thermal evaporation and annealed at 423, 473, and 523 K. X-ray diffraction revealed that the films were initially amorphous, but their amorphous nature decreased with annealing. Optical transmittance and reflectance were measured across a wavelength range of 190– 2500 nm. After annealing, the transmittance dropped from 75% (as-deposited) to 40% at around 520 nm. The optical band gap also narrowed, reducing from 1.67 to 1.40 eV at 523 K. The refractive index showed anomalous dispersion below 900 nm and normal dispersion above, with <em>ε</em><sub>∞</sub> values increasing from 2.14 to 2.74 as the annealing temperature rose. Additionally, the third-order nonlinear optical susceptibility decreased with annealing, with higher values observed in the as-deposited films. These results suggest that Erythrosine B thin films have the potential for photonic and optoelectronic applications due to their adjustable optical properties and thermal stability.</div></div>","PeriodicalId":23182,"journal":{"name":"Thin Solid Films","volume":"810 ","pages":"Article 140602"},"PeriodicalIF":2.0000,"publicationDate":"2025-01-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Thin Solid Films","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0040609025000033","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, COATINGS & FILMS","Score":null,"Total":0}
引用次数: 0
Abstract
This study investigates the structural and optical properties of Erythrosine B thin films. The films were fabricated through thermal evaporation and annealed at 423, 473, and 523 K. X-ray diffraction revealed that the films were initially amorphous, but their amorphous nature decreased with annealing. Optical transmittance and reflectance were measured across a wavelength range of 190– 2500 nm. After annealing, the transmittance dropped from 75% (as-deposited) to 40% at around 520 nm. The optical band gap also narrowed, reducing from 1.67 to 1.40 eV at 523 K. The refractive index showed anomalous dispersion below 900 nm and normal dispersion above, with ε∞ values increasing from 2.14 to 2.74 as the annealing temperature rose. Additionally, the third-order nonlinear optical susceptibility decreased with annealing, with higher values observed in the as-deposited films. These results suggest that Erythrosine B thin films have the potential for photonic and optoelectronic applications due to their adjustable optical properties and thermal stability.
期刊介绍:
Thin Solid Films is an international journal which serves scientists and engineers working in the fields of thin-film synthesis, characterization, and applications. The field of thin films, which can be defined as the confluence of materials science, surface science, and applied physics, has become an identifiable unified discipline of scientific endeavor.