Optical design for 3D detection of surface defects on ultra-precision curved optical elements based on micro structured-light

IF 5 2区 物理与天体物理 Q1 OPTICS
Mingze Li , Xi Hou , Wenchuan Zhao , Yuancheng Zhao , Yutong Meng
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引用次数: 0

Abstract

With the growing demand for ultra-precision curved optical element applications, the requirements for element quality are becoming more stringent. Surface defect detection, as one of the key aspects of quality control of optical elements, is crucial to ensure the performance of optical systems. Among them, the micrometer-wide and tens of nanometers-deep weak defects on the surface of ultra-precision optical elements are one of the most difficult points to detect. The commonly used structured-light detection method needs to adjust each component individually, and all the indexes are difficult to be considered and utilized simultaneously. So this paper develops an optimized design for 3D detection of weak defects on curved surfaces based on micro structured-light detection (MSLD), which can achieve a balance of field of view (FOV), depth of field (DOF), and resolution. The system is capable of realizing a FOV of 2 mm × 2 mm while achieving a width resolution of 1 μm. The system has been further manufactured, mounted, and built, and key indexes such as FOV, DOF, and resolution have been measured for the system to verify the validity of the design. Further detection experiments of weak defects with different shapes on the surfaces of curved optical elements are carried out and the results are compared with those of a white light interferometer (WLI), demonstrating that the designed MSLD system can achieve micrometer width resolution and nanometer depth resolution.
基于微结构光的超精密曲面光学元件表面缺陷三维检测光学设计
随着超精密曲面光学元件应用需求的不断增长,对元件质量的要求也越来越严格。表面缺陷检测是光学元件质量控制的关键环节之一,是保证光学系统性能的关键。其中,超精密光学元件表面微米宽、数十纳米深的微弱缺陷是检测的难点之一。常用的结构光检测方法需要对各个组成部分进行单独调整,难以同时考虑和利用所有指标。为此,本文提出了一种基于微结构光检测(MSLD)的曲面弱缺陷三维检测优化设计,实现了视场(FOV)、景深(DOF)和分辨率的平衡。该系统能够实现2 mm × 2 mm的视场,同时实现1 μm的宽度分辨率。对系统进行了进一步的制造、安装和搭建,并对系统的视场、自由度、分辨率等关键指标进行了测量,验证了设计的有效性。进一步对弯曲光学元件表面不同形状的弱缺陷进行了检测实验,并与白光干涉仪(WLI)的检测结果进行了比较,结果表明所设计的MSLD系统可以实现微米宽度分辨率和纳米深度分辨率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
8.50
自引率
10.00%
发文量
1060
审稿时长
3.4 months
期刊介绍: Optics & Laser Technology aims to provide a vehicle for the publication of a broad range of high quality research and review papers in those fields of scientific and engineering research appertaining to the development and application of the technology of optics and lasers. Papers describing original work in these areas are submitted to rigorous refereeing prior to acceptance for publication. The scope of Optics & Laser Technology encompasses, but is not restricted to, the following areas: •development in all types of lasers •developments in optoelectronic devices and photonics •developments in new photonics and optical concepts •developments in conventional optics, optical instruments and components •techniques of optical metrology, including interferometry and optical fibre sensors •LIDAR and other non-contact optical measurement techniques, including optical methods in heat and fluid flow •applications of lasers to materials processing, optical NDT display (including holography) and optical communication •research and development in the field of laser safety including studies of hazards resulting from the applications of lasers (laser safety, hazards of laser fume) •developments in optical computing and optical information processing •developments in new optical materials •developments in new optical characterization methods and techniques •developments in quantum optics •developments in light assisted micro and nanofabrication methods and techniques •developments in nanophotonics and biophotonics •developments in imaging processing and systems
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