Tailoring the properties of physical vapor deposition grown α-MoO3 as an active optoelectronic material: Study on the effect of thickness and proton irradiation

IF 4.2 3区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Ravindra Kumar , Vikash Mishra , Tejendra Dixit , S.N. Sarangi , D. Samal , Swastibrata Bhattacharyya , Prahalad Kanti Barman , Pramoda K. Nayak , M.S. Ramachandra Rao
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Abstract

Here, we report the synthesis of layered α-MoO3 flakes using the physical vapor deposition (PVD) technique and mechanical exfoliation of α-MoO3 ribbons (obtained from the PVD technique). Proton irradiation has been carried out on the exfoliated multilayer α-MoO3 flake using a 30 keV source with a fluence of 1016 ions/cm2 to tune the light emission from this material. The excitation wavelength-dependent study has been carried out on the proton irradiated α-MoO3 flake. Interestingly, a sharp photoluminescence (PL) peak emerges in the proton irradiated α-MoO3 flake at 540 nm, which is absent in the non-irradiated flakes, and the proton irradiation-induced PL is found to be independent of the excitation wavelength, indicating the formation of localized defect states. Furthermore, the temperature-dependent PL studies on the proton-irradiated flakes confirm the robust stability of the emission. A rigorous theoretical calculation has been carried out to understand the origin of the additional peak at 540 nm in PL spectra. Results obtained from density functional theory (DFT) calculations suggest that the PL emission originates due to the presence of oxygen defect states in the irradiated α-MoO3 flake, while such additional peak at a lower energy range is absent in the case of non-irradiated α-MoO3. The present study can be useful in exploring proton irradiated α-MoO3 for optoelectronic applications.

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来源期刊
Materials Science in Semiconductor Processing
Materials Science in Semiconductor Processing 工程技术-材料科学:综合
CiteScore
8.00
自引率
4.90%
发文量
780
审稿时长
42 days
期刊介绍: Materials Science in Semiconductor Processing provides a unique forum for the discussion of novel processing, applications and theoretical studies of functional materials and devices for (opto)electronics, sensors, detectors, biotechnology and green energy. Each issue will aim to provide a snapshot of current insights, new achievements, breakthroughs and future trends in such diverse fields as microelectronics, energy conversion and storage, communications, biotechnology, (photo)catalysis, nano- and thin-film technology, hybrid and composite materials, chemical processing, vapor-phase deposition, device fabrication, and modelling, which are the backbone of advanced semiconductor processing and applications. Coverage will include: advanced lithography for submicron devices; etching and related topics; ion implantation; damage evolution and related issues; plasma and thermal CVD; rapid thermal processing; advanced metallization and interconnect schemes; thin dielectric layers, oxidation; sol-gel processing; chemical bath and (electro)chemical deposition; compound semiconductor processing; new non-oxide materials and their applications; (macro)molecular and hybrid materials; molecular dynamics, ab-initio methods, Monte Carlo, etc.; new materials and processes for discrete and integrated circuits; magnetic materials and spintronics; heterostructures and quantum devices; engineering of the electrical and optical properties of semiconductors; crystal growth mechanisms; reliability, defect density, intrinsic impurities and defects.
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